IBM Journal of Research and Development, Volume 33, 1989

selected papers

Volume 33, Number 1, January 1989

Volume 33, Number 2, March 1989

Geometric Modeling Vector Processing Weighted Random-Pattern Testing Integrated-Circuit Chip Yield

Volume 33, Number 4, July 1989

Volume 33, Number 5, September 1989

Volume 33, Number 6, November 1989