IBM Journal of Research and Development, Volume 33, 1989
Volume 33, Number 1, January 1989
Volume 33, Number 2, March 1989
Weighted Random-Pattern Testing
Integrated-Circuit Chip Yield
Charles H. Stapper
: Large-Area Fault Clusters and Fault Tolerance in VLSI Circuits: A Review.
Volume 33, Number 4, July 1989
Volume 33, Number 5, September 1989
: Frames, Semantic Networks, and Object-Oriented Programming in APL2.
Volume 33, Number 6, November 1989
Peter A. Franaszek
: Coding for Constrained Channels: A Comparison of Two Approaches.
David R. Irvin
: Preserving the Integrity of Cyclic-Redundancy Checks when Protected Text is Internationally Altered.