Journal of Electronic Testing, Volume 7
Volume 7, Numbers 1-2, August 1995
Vishwani D. Agrawal: Editorial - Special issue on partial scan design. 5-6- Johannes Steensma, Francky Catthoor, Hugo De Man: Partial scan and symbolic test at the register-transfer level. 7-23
- Kee Sup Kim, Charles R. Kime: Partial scan flip-flop selection by use of empirical testability. 47-59
- Tatiana Orenstein, Zvi Kohavi, Irith Pomeranz: An optimal algorithm for cycle breaking in directed graphs. 71-81
- Srimat T. Chakradhar, Arun Balakrishnan, Vishwani D. Agrawal: An exact algorithm for selecting partial scan flip-flops. 83-93
- Sujit Dey, Srimat T. Chakradhar: Design of testable sequential circuits by repositioning flip-flops. 105-114
- Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita: Partial scan design and test sequence generation based on reduced scan shift method. 115-124
- Chih-Jen Lin, Yervant Zorian, Sudipta Bhawmik: Integration of partial scan and built-in self-test. 125-137
Volume 7, Number 3, December 1995
- Vishwani D. Agrawal: Editorial. 143
- Andrea Boni, G. Chiorboli, G. Franco, M. Ostacoli, S. Mazzoleni: Short test procedures for R-2R D/A converters by electrical modeling and application of the ambiguity algorithm. 145-155
- Ankan K. Pramanick, Sudhakar M. Reddy: Efficient multiple path propagating tests for delay faults. 157-172
- Harry Hengster, Rolf Drechsler, Bernd Becker: On local transformations and path delay fault testability. 173-191
- T. Raju Damarla, Charles E. Stroud, Avinash Sathaye: Multiple error detection and identification via signature analysis. 193-207
- Shujian Zhang, Rod Byrne, Jon C. Muzio, D. Michael Miller: Quantitative analysis for linear hybrid cellular automata and LFSR as built-in self-test generators for sequential faults. 209-221
- Claudio Costi, Micaela Serra, Donatella Sciuto: A new DFT methodology for sequential circuits. 223-240
- Leendert M. Huisman: Yield fluctuations and defect models. 241-254
- V. C. Prasad, N. Sarat Chandra Babu: On minimal set of test nodes for fault dictionary of analog circuit fault diagnosis. 255-258
data released under the ODC-BY 1.0 license. See also our legal information page
last updated on 2013-06-18T214307 by the dblp team