Volume 26,
Number 1,
February 2010
Special Issue on Analog,
Mixed-Signal and RF Testing; Guest Editor:
Karim Arabi
- Vishwani D. Agrawal:
Editorial.
1-2
- Karim Arabi:
Guest Editorial.
5
- Qi Fan:
General Design for Test Guidelines for RF IC.
7-12
- Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee:
Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation Principles.
13-24
- Pedro Fonseca da Mota, José Machado da Silva, Ricardo A. Veiga:
Estimation of RF PA Nonlinearities after Cross-correlating Current and Output Voltage.
25-35
- R. M. Ayadi, M. Masmoudi:
Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAs.
37-45
- Maria Angeles Jalón, Eduardo J. Peralías:
ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method.
47-58
- Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting (Tim) Cheng:
Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case Study.
59-71
- Hongjoong Shin, Joonsung Park, Jacob A. Abraham:
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.
73-86
- David C. Keezer, Carl Gray, Dany Minier, Patrice Ducharme:
Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic.
87-96
- Rajeev Narayanan, Mohamed H. Zaki, Sofiène Tahar:
Using Stochastic Differential Equation for Verification of Noise in Analog/RF Circuits.
97-109
- Norbert Dumas, Florence Azaïs, Frédérick Mailly, Pascal Nouet:
Study of an Electrical Setup for Capacitive MEMS Accelerometers Test and Calibration.
111-125
- Yindar Chuo, Bozena Kaminska:
Testing Multilayer Flexible Wireless Multisensor Platforms.
127-138
- Matthew Giassa, Ajit Khosla, Bonnie Gray, Ash Parameswaran, Kirpal Kohli, Ramani Ramaseshan:
Applications for Low Frequency Impedance Analysis Systems.
139-144
Volume 26,
Number 2,
April 2010
Special Issue on High-Level Design Validation and Test; Guest Editor:
Prabhat Mishra
- V. D. Agrawal:
Editorial.
145
- Prabhat Mishra:
Guest Editorial.
149-150
- Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwara:
RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences.
151-164
- Maheshwar Chandrasekar, Nikhil P. Rahagude, Michael S. Hsiao:
Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test Generation.
165-176
- Yongquan Fan, Zeljko Zilic:
Qualifying Serial Interface Jitter Rapidly and Cost-effectively.
177-193
- Kanupriya Gulati, Sunil P. Khatri:
Fault Table Computation on GPUs.
195-209
- Jason G. Tong, Marc Boule, Zeljko Zilic:
Defining and Providing Coverage for Assertion-Based Dynamic Verification.
211-225
- Bin Xue, Sandeep K. Shukla:
Analysis of Scheduled Latency Insensitive Systems with Periodic Clock Calculus.
227-242
- In-Ho Moon, Kevin Harer:
Learning from Constraints for Formal Property Checking.
243-259
- Gianpiero Cabodi, Leandro Dipietro, Marco Murciano, Sergio Nocco:
Finding Multiple Equivalence-Preserving Transformations in Combinational Circuits through Incremental-SAT.
261-278
- Sven Verdoolaege, Martin Palkovic, Maurice Bruynooghe, Gerda Janssens, Francky Catthoor:
Experience with Widening Based Equivalence Checking in Realistic Multimedia Systems.
279-292
Volume 26,
Number 3,
June 2010
- Vishwani D. Agrawal:
Editorial.
293
- Maynard Falconer, Garrison Greenwood, Kristina Morgan, KiranKumar Kamisetty, Adam Norman, Konika Ganguly:
Using Evolutionary Algorithms for Signal Integrity Assessment of High-Speed Data Buses.
297-305
- Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Rolf Drechsler:
MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics.
307-322
- M. Kiran Kumar Reddy, Bharadwaj S. Amrutur, Rubin A. Parekhji:
False Error Vulnerability Study of On-line Soft Error Detection Mechanisms.
323-335
- Osnat Keren:
One-to-Many: Context-Oriented Code for Concurrent Error Detection.
337-353
- Luca Testa, Hervé Lapuyade, Yann Deval, Jean-Louis Carbonéro, Jean-Baptiste Begueret:
Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors.
355-365
- Hyoung-Kook Kim, Wen-Ben Jone, Laung-Terng Wang:
Fault Modeling and Analysis for Resistive Bridging Defects in a Synchronizer.
367-392
- Wang-Dauh Tseng, Lung-Jen Lee:
Test Data Compression Using Multi-dimensional Pattern Run-length Codes.
393-400
Volume 26,
Number 4,
August 2010
- Vishwani D. Agrawal:
Editorial.
401
- Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam:
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices.
405-417
- Ting Long, Houjun Wang, Shulin Tian, Jianguo Huang, Bing Long:
Test Generation Algorithm for Linear Systems Based on Genetic Algorithm.
419-428
- Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda:
A BIST Solution for Frequency Domain Characterization of Analog Circuits.
429-441
- Cleonilson Protásio de Souza, Francisco Marcos de Assis, Raimundo Carlos Silvério Freire:
A New Built-in TPG Based on Berlekamp-Massey Algorithm.
443-451
- Ardy van den Berg, Pengwei Ren, Erik Jan Marinissen, Georgi Gaydadjiev, Kees Goossens:
Bandwidth Analysis of Functional Interconnects Used as Test Access Mechanism.
453-464
- Sobeeh Almukhaizim, Shouq Alsubaihi, Ozgur Sinanoglu:
On the Application of Dynamic Scan Chain Partitioning for Reducing Peak Shift Power.
465-481
- Berndt M. Gammel, Stefan Mangard:
On the Duality of Probing and Fault Attacks.
483-493
Volume 26,
Number 5,
October 2010
- Vishwani D. Agrawal:
Editorial.
495
- Jacob D. Biamonte, Jeff S. Allen, Marek A. Perkowski:
Fault Models for Quantum Mechanical Switching Networks.
499-511
- Ahmad A. Al-Yamani, Edward J. McCluskey:
Test Set Compression Through Alternation Between Deterministic and Pseudorandom Test Patterns.
513-521
- Chenglin Yang, Shulin Tian, Bing Long, Fang Chen:
A Novel Test Point Selection Method for Analog Fault Dictionary Techniques.
523-534
- Yasser Sedaghat, Seyed Ghassem Miremadi:
Classification of Activated Faults in the FlexRay-Based Networks.
535-547
- Keunyoung Park, Sang Guun Yoo, Taejun Kim, Juho Kim:
JTAG Security System Based on Credentials.
549-557
- Zhen Wang, Mark G. Karpovsky, Konrad J. Kulikowski:
Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes.
559-580
- Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich:
Efficient Concurrent Self-Test with Partially Specified Patterns.
581-594
Volume 26,
Number 6,
December 2010
- Vishwani D. Agrawal:
Editorial.
595-596
- Ramyanshu Datta, Antony Sebastine, Ashwin Raghunathan, Gary D. Carpenter, Kevin J. Nowka, Jacob A. Abraham:
On-Chip Delay Measurement Based Response Analysis for Timing Characterization.
599-619
- Aymen Ladhar, Mohamed Masmoudi:
An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis.
621-639
- Jari Hannu, Teuvo Saikkonen, Juha Häkkinen, Juha Karttunen, Markku Moilanen:
Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture.
641-658
- Prashant Dubey, Akhil Garg, Shashank Mahajan:
Study of Read Recovery Dynamic Faults in 6T SRAMS and Method to Improve Test Time.
659-666
- Kazuteru Namba, Hideo Ito:
Chiba Scan Delay Fault Testing with Short Test Application Time.
667-677
- Usha Sandeep Mehta, Kankar S. Dasgupta, Nirnjan M. Devashrayee:
Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead.
679-688
- Stefano Gandini, Walter Ruzzarin, Ernesto Sánchez, Giovanni Squillero, Alberto Paolo Tonda:
A Framework for Automated Detection of Power-related Software Errors in Industrial Verification Processes.
689-697
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