Volume 25,
Number 1,
February 2009
Special Issue on Defect and Tolerance; Guest Editors Cristiana Bolchini and Yong-Bin Kim
- Vishwani D. Agrawal:
Editorial.
1
- Cristiana Bolchini, Yong-Bin Kim:
Guest Editorial.
9-10
- Masaru Fukushi, Susumu Horiguchi, Luke Demoracski, Fabrizio Lombardi:
An Efficient Framework for Scalable Defect Isolation in Large Scale Networks of DNA Self-Assembly.
11-23
- Masoud Hashempour, Zahra Mashreghian Arani, Fabrizio Lombardi:
Healing DNA Self-Assemblies Using Punctures.
25-37
- Xiaojun Ma, Jing Huang, Cecilia Metra, Fabrizio Lombardi:
Detecting Multiple Faults in One-Dimensional Arrays of Reversible QCA Gates.
39-54
- Faizal Karim, Marco Ottavi, Hamidreza Hashempour, Vamsi Vankamamidi, Konrad Walus, André Ivanov, Fabrizio Lombardi:
Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits.
55-66
- Rani S. Ghaida, Payman Zarkesh-Ha:
A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects.
67-77
- Michele Favalli, Marcello Dalpasso:
How Many Test Vectors We Need to Detect a Bridging Fault?
79-95
- Kazuteru Namba, Yoshikazu Matsui, Hideo Ito:
Test Compression for IP Core Testing with Reconfigurable Network and Fixing-Flipping Coding.
97-105
- Mario García-Valderas, Luis Entrena, Raúl Fernández Cardenal, Celia López-Ongil, Marta Portela-García:
SET Emulation Under a Quantized Delay Model.
107-116
- Waleed K. Al-Assadi, Sindhu Kakarla:
Design for Test of Asynchronous NULL Convention Logic (NCL) Circuits.
117-126
Volume 25,
Numbers 2-3,
June 2009
- Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel:
A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash.
127-144
- Hao-Chiao Hong, Sheng-Chuan Liang, Hong-Chin Song:
A Built-in-Self-Test Sigma-Delta ADC Prototype.
145-156
- Chenglin Yang, Shulin Tian, Bing Long:
Test Points Selection for Analog Fault Dictionary Techniques.
157-168
- Reza M. Rad, Jim Plusquellic:
A Novel Fault Localization Technique Based on Deconvolution and Calibration of Power Pad Transients Signals.
169-185
- Angel Quiros-Olozabal, Ma de los Angeles Cifredo Chacon:
A New Algorithm for the Selection of Control Cells in Boundary-Scan Interconnect Test.
187-195
- Mihir R. Choudhury, Quming Zhou, Kartik Mohanram:
Soft Error Rate Reduction Using Circuit Optimization and Transient Filter Insertion.
197-207
Volume 25,
Numbers 4-5,
August 2009
- Vishwani D. Agrawal:
Editorial.
209
- Rajeshwary Tayade, Jacob A. Abraham:
Critical Path Selection for Delay Testing Considering Coupling Noise.
213-223
- Mehran Mozaffari Kermani, Arash Reyhani-Masoleh:
Fault Detection Structures of the S-boxes and the Inverse S-boxes for the Advanced Encryption Standard.
225-245
- Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel:
X-tolerant Test Data Compaction with Accelerated Shift Registers.
247-258
- Stefan Holst, Hans-Joachim Wunderlich:
Adaptive Debug and Diagnosis Without Fault Dictionaries.
259-268
- Giorgio Di Natale, M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre:
A Reliable Architecture for Parallel Implementations of the Advanced Encryption Standard.
269-278
- R. Fernández:
A Modified Charge Pumping Method for Measuring Interface States Up to the Ghz Range.
279-283
Volume 25,
Number 6,
December 2009
- Vishwani D. Agrawal:
Editorial.
285
- Maksim Jenihhin, Jaan Raik, Anton Chepurov, Raimund Ubar:
PSL Assertion Checking Using Temporally Extended High-Level Decision Diagrams.
289-300
- Carsten Wegener, Heinz Mattes, Stéphane Kirmser, Frank Demmerle, Sebastian Sattler:
Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores.
301-308
- Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris:
On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction.
309-321
- Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang:
LPTest: a Flexible Low-Power Test Pattern Generator.
323-335
- Fangyuan Nan, Yaonan Wang, Fuhai Li, Weifeng Yang, Xiaoping Ma:
A Better Method than Tail-fitting Algorithm for Jitter Separation Based on Gaussian Mixture Model.
337-342
- Mary D. Pulukuri, Charles E. Stroud:
On Built-In Self-Test for Adders.
343-346
- Kyuchull Kim, Kewal K. Saluja:
Low-Area Wrapper Cell Design for Hierarchical SoC Testing.
347-352
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