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Electronic Notes in Theoretical Computer Science
, Volume 111
Volume 111, January 2005
Proceedings of the Workshop on Model Based Testing (MBT 2004)
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dblp key:
journals/entcs/GurevichPK05
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Yuri Gurevich
,
Alexander K. Petrenko
,
Alexander Kossatchev
:
Preface.
1-3
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dblp key:
journals/entcs/Stobie05
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Keith Stobie
:
Model Based Testing in Practice at Microsoft.
5-12
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journals/entcs/ConradFS05
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Mirko Conrad
,
Ines Fey
,
Sadegh Sadeghipour
:
Systematic Model-Based Testing of Embedded Automotive Software.
13-26
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dblp key:
journals/entcs/ScolloZ05
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Giuseppe Scollo
,
Silvia Zecchini
:
Architectural Unit Testing.
27-52
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dblp key:
journals/entcs/KervinenV05
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Antti Kervinen
,
Pablo Virolainen
:
Heuristics for Faster Error Detection With Automated Black Box Testing.
53-71
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dblp key:
journals/entcs/ChoL05
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Seung Mo Cho
,
Jae Wook Lee
:
Lightweight Specification-based Testing of Memory Cards: A Case Study.
73-91
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dblp key:
journals/entcs/MarreB05
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Bruno Marre
,
Benjamin Blanc
:
Test Selection Strategies for Lustre Descriptions in GATeL.
93-111
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dblp key:
journals/entcs/SatpathyLB05
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Manoranjan Satpathy
,
Michael Leuschel
,
Michael J. Butler
:
ProTest: An Automatic Test Environment for B Specifications.
113-136
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dblp key:
journals/entcs/Kuliamin05
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Victor V. Kuliamin
:
Multi-paradigm Models as Source for Automated Test Construction.
137-160
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dblp key:
journals/entcs/GrossSD05
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Hans-Gerhard Groß
,
Ina Schieferdecker
,
George Din
:
Model-Based Built-In Tests.
161-182