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| 2012 | ||
|---|---|---|
| 41 | Jean Michel Portal, Marc Bocquet, Damien Deleruyelle, Christophe Muller: Non-Volatile Flip-Flop Based on Unipolar ReRAM for Power-Down Applications. J. Low Power Electronics 8(1): 1-10 (2012) | |
| 2011 | ||
| 40 | Ch. Muller, Damien Deleruyelle, Olivier Ginez, Jean Michel Portal, Marc Bocquet: Design challenges for prototypical and emerging memory concepts relying on resistance switching. CICC 2011: 1-7 | |
| 39 | A. Marzaki, V. Bidal, R. Laffont, Wenceslas Rahajandraibe, Jean Michel Portal, Rachid Bouchakour: PSP based DCG-FGT transistor model including characterization procedure. ICECS 2011: 228-231 | |
| 38 | Y. Joly, L. Truphemus, L. Lopez, Jean Michel Portal, Hassen Aziza, F. Julien, Pascal Fornara: Temperature and hump effect impact on output voltage spread of low power bandgap designed in the sub-threshold area. ISCAS 2011: 2549-2552 | |
| 37 | Fabrice Rigaud, Jean Michel Portal, Hassen Aziza, Didier Née, Julien Vast, Fabrice Argoud, Bertrand Borot: Back-end soft and hard defect monitoring using a single test chip. Microelectronics Reliability 51(6): 1136-1141 (2011) | |
| 36 | Y. Joly, L. Lopez, Jean Michel Portal, Hassen Aziza, Jean-Luc Ogier, Y. Bert, F. Julien, Pascal Fornara: Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress. Microelectronics Reliability 51(9-11): 1561-1563 (2011) | |
| 2009 | ||
| 35 | Olivier Ginez, Jean Michel Portal, Hassen Aziza: An on-line testing scheme for repairing purposes in Flash memories. DDECS 2009: 120-123 | |
| 34 | Olivier Ginez, Jean Michel Portal, Ch. Muller: Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections. European Test Symposium 2009: 61-66 | |
| 33 | Laurent Remy, Philippe Coll, Fabrice Picot, Philippe Mico, Jean Michel Portal: Definition of an innovative filling structure for digital blocks : the DFM filler cell. ICECS 2009: 73-76 | |
| 2008 | ||
| 32 | Manuel Sellier, Jean Michel Portal, Bertrand Borot, Steve Colquhoun, Richard Ferrant, Frédéric Boeuf, Alexis Farcy: Predictive Delay Evaluation on Emerging CMOS Technologies: A Simulation Framework. ISQED 2008: 492-497 | |
| 31 | Olivier Ginez, Jean Michel Portal, Hassen Aziza: A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories. ITC 2008: 1-10 | |
| 30 | Laurent Remy, Philippe Coll, Fabrice Picot, Philippe Mico, Jean Michel Portal: Metal filling impact on standard cells: definition of the metal fill corner concept. SBCCI 2008: 16-21 | |
| 29 | Hassen Aziza, Emmanuel Bergeret, Jean Michel Portal, Olivier Ginez: A Novel Low Power Oriented Design Methodology for Analog Blocks. J. Low Power Electronics 4(1): 60-67 (2008) | |
| 2007 | ||
| 28 | Laurent Lopez, Jean Michel Portal, Didier Née: A New Embedded Measurement Structure for eDRAM Capacitor CoRR abs/0710.4736: (2007) | |
| 2006 | ||
| 27 | B. Saillet, A. Regnier, Jean Michel Portal, B. Delsuc, R. Laffont, Pascal Masson, Rachid Bouchakour: MM11 based flash memory cell model including characterization procedure. ISCAS 2006 | |
| 2005 | ||
| 26 | Laurent Lopez, Jean Michel Portal, Didier Née: A New Embedded Measurement Structure for eDRAM Capacitor. DATE 2005: 462-463 | |
| 25 | B. Saillet, Jean Michel Portal, Didier Née: Flash Memory Cell: Parametric Test Data Reconstruction for Process Monitoring. DFT 2005: 131-139 | |
| 24 | Jean Michel Portal, Hassen Aziza, Didier Née: EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement. J. Electronic Testing 21(1): 33-42 (2005) | |
| 2004 | ||
| 23 | S. Bernardini, Jean Michel Portal, Pascal Masson: A Tunneling Model for Gate Oxide Failure in Deep Sub-Micron Technology. DATE 2004: 1404-1405 | |
| 22 | Anna Labbé, Annie Pérez, Jean Michel Portal: Efficient hardware implementation of a CRYPTO-MEMORY based on AES algorithm and SRAM architecture. ISCAS (2) 2004: 637-640 | |
| 2003 | ||
| 21 | L. Forli, Jean Michel Portal, Didier Née, Bertrand Borot: Infrastructure IP for Back-End Yield Improvement. ITC 2003: 1129-1134 | |
| 20 | Jean Michel Portal, Hassen Aziza, Didier Née: EEPROM Memory: Threshold Voltage Built In Self Diagnosis. ITC 2003: 23-28 | |
| 2002 | ||
| 19 | Jean Michel Portal, L. Forli, Didier Née: Floating-gate EEPROM cell: threshold voltage sensibility to geometry. ISCAS (1) 2002: 557-560 | |
| 18 | Jean Michel Portal, L. Forli, Didier Née: Floating-gate EEPROM cell model based on MOS model 9. ISCAS (3) 2002: 799-802 | |
| 17 | Jean Michel Portal, L. Forli, Hassen Aziza, Didier Née: An Automated Methodology to Diagnose Geometric Defect in the EEPROM Cell. ITC 2002: 31-36 | |
| 16 | Jean Michel Portal, L. Forli, Hassen Aziza, Didier Née: An Automated Design Methodology for EEPROM Cell (ADE). MTDT 2002: 137-142 | |
| 2001 | ||
| 15 | Michel Renovell, Penelope Faure, Jean Michel Portal, Joan Figueras, Yervant Zorian: IS-FPGA : a new symmetric FPGA architecture with implicit scan. ITC 2001: 924-931 | |
| 14 | Michel Renovell, Jean Michel Portal, Penelope Faure, Joan Figueras, Yervant Zorian: A Discussion on Test Pattern Generation for FPGA - Implemented Circuits. J. Electronic Testing 17(3-4): 283-290 (2001) | |
| 2000 | ||
| 13 | Michel Renovell, Jean Michel Portal, Penelope Faure, Joan Figueras, Yervant Zorian: TOF: a tool for test pattern generation optimization of an FPGA application oriented test. Asian Test Symposium 2000: 323-328 | |
| 12 | Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: An Approach to Minimize the Test Configuration for the Logic Cells of the Xilinx XC4000 FPGAs Family. J. Electronic Testing 16(3): 289-299 (2000) | |
| 11 | Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: Testing the Local Interconnect Resources of SRAM-Based FPGA's. J. Electronic Testing 16(5): 513-520 (2000) | |
| 1999 | ||
| 10 | Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: Minimizing the Number of Test Configurations for Different FPGA Families. Asian Test Symposium 1999: 363-368 | |
| 9 | Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: Testing the Configurable Interconnect/Logic Interface of SRAM-Based FPGA's. DATE 1999: 618-622 | |
| 8 | Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: SRAM-Based FPGAs: Testing the Embedded RAM Modules. J. Electronic Testing 14(1-2): 159-167 (1999) | |
| 1998 | ||
| 7 | Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: SRAM-Based FPGA's: Testing the Interconnect/Logic Interface. Asian Test Symposium 1998: 266-271 | |
| 6 | Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: RAM-Based FPGA's: A Test Approach for the Configurable Logic. DATE 1998: 82-88 | |
| 5 | Cecilia Metra, Michel Renovell, G. Mojoli, Jean Michel Portal, Sandro Pastore, Joan Figueras, Yervant Zorian, Davide Salvi, Giacomo R. Sechi: Novel Technique for Testing FPGAs. DATE 1998: 89-94 | |
| 4 | Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: SRAM-Based FPGAs: A Fault Model for the Configurable Logig Modules. FPL 1998: 139-148 | |
| 3 | Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: SRAM-based FPGA's: testing the LUT/RAM modules. ITC 1998: 1102-1111 | |
| 2 | Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: Testing the Interconnect of RAM-Based FPGAs. IEEE Design & Test of Computers 15(1): 45-50 (1998) | |
| 1997 | ||
| 1 | Michel Renovell, Jean Michel Portal, Joan Figueras, Yervant Zorian: Test Pattern and Test Configuration Generation Methodology for the Logic of RAM-Based FPGA. Asian Test Symposium 1997: 254- | |
Colors in the list of coauthors
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