J. Petr

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2001

1 D. Manic, J. Petr, R. S. Popovic: Die stress drift measurement in IC plastic packages using the piezo-Hall effect. Microelectronics Reliability 41(5): 767-771 (2001)

	2001
1		D. Manic, J. Petr, R. S. Popovic: Die stress drift measurement in IC plastic packages using the piezo-Hall effect. Microelectronics Reliability 41(5): 767-771 (2001)

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