 | 2010 |
| 4 |  | Philippe Galy,
Sylvain Dudit,
Michel Vallet,
Ph. Larre,
M. Bilinski,
E. Petit,
J. Beltritti,
A. Dray,
J. Jimenez,
F. Jezequel,
R. Chevallier,
C. Boutonnat,
V. Varo:
Inventory of silicon signatures induced by CDM event on deep sub-micronic CMOS-BICMOS technologies.
Microelectronics Reliability 50(9-11): 1388-1392 (2010) |
| 2009 |
| 3 |  | Philippe Galy,
Sylvain Dudit,
Michel Vallet,
C. Richier,
Christophe Entringer,
F. Jezequel,
E. Petit,
J. Beltritti:
Impact and damage on deep sub-micron CMOS technology induced by substrate current due to ESD stress.
Microelectronics Reliability 49(9-11): 1107-1110 (2009) |
| 2003 |
| 2 |  | S. Glaeson,
E. Petit:
Designing System-Level Software Solutions for Open OS's on 3g Wireless Handsets.
DATE 2003: 20040 |
| 1998 |
| 1 |  | A. Raji,
A. Thaïbaoui,
E. Petit,
P. Bunel,
G. Mimoun:
A gray-level transformation-based method for image enhancement.
Pattern Recognition Letters 19(13): 1207-1212 (1998) |