Marc Perbost

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1997

1 Marc Perbost, Ludovic Le Lan, Christian Landrault: Automatic Testability Analysis of Boards and MCMs at Chip Level. Asian Test Symposium 1997: 36-41

	1997
1		Marc Perbost, Ludovic Le Lan, Christian Landrault: Automatic Testability Analysis of Boards and MCMs at Chip Level. Asian Test Symposium 1997: 36-41

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