Harold G. Parks

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2001

1 Loren J. Wise, Ronald D. Schrimpf, Harold G. Parks, Kenneth F. Galloway: A generalized model for the lifetime of microelectronic components, applied to storage conditions. Microelectronics Reliability 41(2): 317-322 (2001)

	2001
1		Loren J. Wise, Ronald D. Schrimpf, Harold G. Parks, Kenneth F. Galloway: A generalized model for the lifetime of microelectronic components, applied to storage conditions. Microelectronics Reliability 41(2): 317-322 (2001)

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