 | 2011 |
| 10 |  | Joonsung Park,
Hongjoong Shin,
Jacob A. Abraham:
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model.
J. Electronic Testing 27(3): 321-334 (2011) |
| 9 |  | Kihyuk Han,
Joonsung Park,
Jae Wook Lee,
Jaeyong Chung,
Eonjo Byun,
Cheol-Jong Woo,
Sejang Oh,
Jacob A. Abraham:
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.
J. Electronic Testing 27(4): 429-439 (2011) |
| 2010 |
| 8 |  | Joonsung Park,
Jae Wook Lee,
Jaeyong Chung,
Kihyuk Han,
Jacob A. Abraham,
Eonjo Byun,
Cheol-Jong Woo,
Sejang Oh:
At-speed Test of High-Speed DUT Using Built-Off Test Interface.
Asian Test Symposium 2010: 269-274 |
| 7 |  | Jaeyong Chung,
Joonsung Park,
Jacob A. Abraham,
Eonjo Byun,
Cheol-Jong Woo:
Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate.
VTS 2010: 33-38 |
| 6 |  | Hongjoong Shin,
Joonsung Park,
Jacob A. Abraham:
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.
J. Electronic Testing 26(1): 73-86 (2010) |
| 2009 |
| 5 |  | Joonsung Park,
Jaeyong Chung,
Jacob A. Abraham:
LFSR-Based Performance Characterization of Nonlinear Analog and Mixed-Signal Circuits.
Asian Test Symposium 2009: 373-378 |
| 4 |  | Kihyuk Han,
Joonsung Park,
Jae Wook Lee,
Jacob A. Abraham,
Eonjo Byun,
Cheol-Jong Woo,
Sejang Oh:
Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.
European Test Symposium 2009: 129-134 |
| 2008 |
| 3 |  | Joonsung Park,
Hongjoong Shin,
Jacob A. Abraham:
Parallel Loopback Test of Mixed-Signal Circuits.
VTS 2008: 309-316 |
| 2007 |
| 2 |  | Joonsung Park,
Hongjoong Shin,
Jacob A. Abraham:
Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model.
ISQED 2007: 495-500 |
| 2006 |
| 1 |  | Hongjoong Shin,
Joonsung Park,
Jacob A. Abraham:
Built-in Fault Diagnosis for Tunable Analog Systems Using an Ensemble Method.
ITC 2006: 1-10 |