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Joonsung Park Coauthor index pubzone.org

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DBLP keys2011
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJoonsung Park, Hongjoong Shin, Jacob A. Abraham: Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model. J. Electronic Testing 27(3): 321-334 (2011)
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung, Eonjo Byun, Cheol-Jong Woo, Sejang Oh, Jacob A. Abraham: Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. J. Electronic Testing 27(4): 429-439 (2011)
2010
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJoonsung Park, Jae Wook Lee, Jaeyong Chung, Kihyuk Han, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh: At-speed Test of High-Speed DUT Using Built-Off Test Interface. Asian Test Symposium 2010: 269-274
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo: Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. VTS 2010: 33-38
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHongjoong Shin, Joonsung Park, Jacob A. Abraham: Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. J. Electronic Testing 26(1): 73-86 (2010)
2009
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJoonsung Park, Jaeyong Chung, Jacob A. Abraham: LFSR-Based Performance Characterization of Nonlinear Analog and Mixed-Signal Circuits. Asian Test Symposium 2009: 373-378
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh: Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. European Test Symposium 2009: 129-134
2008
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJoonsung Park, Hongjoong Shin, Jacob A. Abraham: Parallel Loopback Test of Mixed-Signal Circuits. VTS 2008: 309-316
2007
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJoonsung Park, Hongjoong Shin, Jacob A. Abraham: Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model. ISQED 2007: 495-500
2006
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHongjoong Shin, Joonsung Park, Jacob A. Abraham: Built-in Fault Diagnosis for Tunable Analog Systems Using an Ensemble Method. ITC 2006: 1-10

Coauthor Index

1Jacob A. Abraham [1] [2] [3] [4] [5] [6] [7] [8] [9] [10]
2Eonjo Byun [4] [7] [8] [9]
3Jaeyong Chung [5] [7] [8] [9]
4Kihyuk Han [4] [8] [9]
5Jae Wook Lee [4] [8] [9]
6Sejang Oh [4] [8] [9]
7Hongjoong Shin [1] [2] [3] [6] [10]
8Cheol-Jong Woo [4] [7] [8] [9]

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