Jae Whan Park

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2008

1 Jang Hee Lee, Jae Whan Park: Adaptive burn-in time decision system based on pattern recognition for intelligent reliability control. Expert Syst. Appl. 35(4): 1688-1697 (2008)

	2008
1		Jang Hee Lee, Jae Whan Park: Adaptive burn-in time decision system based on pattern recognition for intelligent reliability control. Expert Syst. Appl. 35(4): 1688-1697 (2008)

Coauthor Index

1 Jang Hee Lee [1]

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