Adelmo Ortiz-Conde

	2011
9		Denise C. Lugo Muñoz, Juan Muci, Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Michelly de Souza, Marcelo A. Pavanello: An explicit multi-exponential model for semiconductor junctions with series and shunt resistances. Microelectronics Reliability 51(12): 2044-2048 (2011)
	2010
8		Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Ching-Sung Ho: Integration-based approach to evaluate the sub-threshold slope of MOSFETs. Microelectronics Reliability 50(2): 312-315 (2010)
	2009
7		Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juan Muci, Denise C. Lugo Muñoz, Álvaro D. Latorre Rey, Ching-Sung Ho, Juin J. Liou: Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction. Microelectronics Reliability 49(7): 689-692 (2009)
	2006
6		Francisco J. García-Sánchez, Adelmo Ortiz-Conde, Juan Muci: Understanding threshold voltage in undoped-body MOSFETs: An appraisal of various criteria. Microelectronics Reliability 46(5-6): 731-742 (2006)
	2002
5		Xiaofang Gao, Juin J. Liou, Joe Bernier, Gregg D. Croft, Adelmo Ortiz-Conde: Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications. IEEE Trans. on CAD of Integrated Circuits and Systems 21(12): 1497-1502 (2002)
4		Rodolfo Quintero, Antonio Cerdeira, Adelmo Ortiz-Conde: Quasi-three-dimensional spice-based simulation of the transient behavior, including plasma spread, of thyristors and over-voltage protectors. Microelectronics Reliability 42(1): 67-76 (2002)
3		Juin J. Liou, R. Shireen, Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Antonio Cerdeira, Xiaofang Gao, Xuecheng Zou, Ching-Sung Ho: Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs. Microelectronics Reliability 42(3): 343-347 (2002)
2		Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Antonio Cerdeira, Magali Estrada, Y. Yue: A review of recent MOSFET threshold voltage extraction methods. Microelectronics Reliability 42(4-5): 583-596 (2002)
	2001
1		Magali Estrada, Antonio Cerdeira, Adelmo Ortiz-Conde, Francisco J. García-Sánchez: Determination of trap cross-section in a-Si: H p-i-n diodes parameters using simulation and parameter extraction. Microelectronics Reliability 41(4): 605-610 (2001)

Coauthor Index

1	Joe Bernier	[5]
2	Antonio Cerdeira	[1] [2] [3] [4]
3	Gregg D. Croft	[5]
4	Magali Estrada	[1] [2]
5	Xiaofang Gao	[3] [5]
6	Francisco J. García-Sánchez	[1] [2] [3] [6] [7] [8] [9]
7	Ching-Sung Ho	[3] [7] [8]
8	Juin J. Liou	[2] [3] [5] [7] [8]
9	Juan Muci	[6] [7] [9]
10	Denise C. Lugo Muñoz	[7] [9]
11	Marcelo A. Pavanello	[9]
12	Rodolfo Quintero	[4]
13	Álvaro D. Latorre Rey	[7]
14	R. Shireen	[3]
15	Michelly de Souza	[9]
16	Y. Yue	[2]
17	Xuecheng Zou	[3]

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