Christian Olgaard

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2004

3 Sule Ozev, Christian Olgaard: Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures. VTS 2004: 217-222

2002

2 Sule Ozev, Christian Olgaard, Alex Orailoglu: Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers. IEEE Design & Test of Computers 19(5): 82-91 (2002)

2001

1 Christian Olgaard, Sule Ozev, Alex Orailoglu: Testability implications in low-cost integrated radio transceivers: a Bluetooth case study. ITC 2001: 965-974

	2004
3		Sule Ozev, Christian Olgaard: Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures. VTS 2004: 217-222
	2002
2		Sule Ozev, Christian Olgaard, Alex Orailoglu: Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers. IEEE Design & Test of Computers 19(5): 82-91 (2002)
	2001
1		Christian Olgaard, Sule Ozev, Alex Orailoglu: Testability implications in low-cost integrated radio transceivers: a Bluetooth case study. ITC 2001: 965-974

Coauthor Index

1 Alex Orailoglu [1] [2]

2 Sule Ozev [1] [2] [3]

Last update Sun Jun 3 16:06:10 2012 CET by the DBLP Team —

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