Alexander Olbrich

	2001
3		M. Porti, X. Blasco, M. Nafría, X. Aymerich, Alexander Olbrich, Bernd Ebersberger: Local current fluctuations before and after breakdown of thin SiO2 films observed with conductive atomic force microscope. Microelectronics Reliability 41(7): 1041-1044 (2001)
2		Bernd Ebersberger, Alexander Olbrich, Christian Boit: Scanning probe microscopy in semiconductor failure analysis. Microelectronics Reliability 41(8): 1231-1236 (2001)
1		Bernd Ebersberger, Alexander Olbrich, Christian Boit: Application of Scanning Probe Microscopy techniques in Semiconductor Failure Analysis. Microelectronics Reliability 41(9-10): 1449-1458 (2001)

Coauthor Index

1	X. Aymerich	[3]
2	X. Blasco	[3]
3	Christian Boit	[1] [2]
4	Bernd Ebersberger	[1] [2] [3]
5	M. Nafría	[3]
6	M. Porti	[3]

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