![]() | ![]() |
| 2008 | ||
|---|---|---|
| 5 | Drew C. Ness, David J. Lilja: Statistically translating low-level error probabilities to increase the accuracy and efficiency of reliability simulations in hardware description languages. ACM Great Lakes Symposium on VLSI 2008: 297-302 | |
| 4 | Drew C. Ness, David J. Lilja: Guiding Circuit Level Fault-Tolerance Design with Statistical Methods. DATE 2008: 348-353 | |
| 2007 | ||
| 3 | Drew C. Ness, Christian J. Hescott, David J. Lilja: Exploring subsets of standard cell libraries to exploit natural fault masking capabilities for reliable logic. ACM Great Lakes Symposium on VLSI 2007: 208-211 | |
| 2 | Christian J. Hescott, Drew C. Ness, David J. Lilja: Scaling Analytical Models for Soft Error Rate Estimation Under a Multiple-Fault Environment. DSD 2007: 641-648 | |
| 1 | Christian J. Hescott, Drew C. Ness, David J. Lilja: MEMESTAR: A Simulation Framework for Reliability Evaluation over Multiple Environments. ISQED 2007: 917-922 | |
| 1 | Christian J. Hescott | [1] [2] [3] |
| 2 | David J. Lilja | [1] [2] [3] [4] [5] |
Data released under the ODC-BY 1.0 license — See also our legal information page