 | 2012 |
|---|
| 12 |       | Stelios Neophytou,
Maria K. Michael:
Test Pattern Generation of Relaxed n-Detect Test Sets.
IEEE Trans. VLSI Syst. 20(3): 410-423 (2012) |
| 2011 |
|---|
| 11 | | Stelios Neophytou,
Kyriakos Christou,
Maria K. Michael:
An Approach for Quantifying Path Correlation in Digital Circuits without any Path or Segment Enumeration.
European Test Symposium 2011: 141-146 |
| 2010 |
|---|
| 10 | | Kyriakos Christou,
Maria K. Michael,
Stelios Neophytou:
Identification of critical primitive path delay faults without any path enumeration.
VTS 2010: 9-14 |
| 9 | | Stelios Neophytou,
Maria K. Michael:
Test Set Generation with a Large Number of Unspecified Bits Using Static and Dynamic Techniques.
IEEE Trans. Computers 59(3): 301-316 (2010) |
| 2009 |
|---|
| 8 | | Stelios Neophytou,
Maria K. Michael,
Kyriakos Christou:
Generating Diverse Test Sets for Multiple Fault Detections Based on Fault Cone Partitioning.
DFT 2009: 401-409 |
| 2008 |
|---|
| 7 | | Stelios Neophytou,
Maria K. Michael:
Two New Methods for Accurate Test Set Relaxation via Test Set Replacement.
ISQED 2008: 827-831 |
| 6 | | Stelios Neophytou,
Maria K. Michael:
On the Relaxation of n-detect Test Sets.
VTS 2008: 187-192 |
| 2007 |
|---|
| 5 | | Stelios Neophytou,
Maria K. Michael:
Hierarchical Fault Compatibility Identification for Test Generation with a Small Number of Specified Bits.
DFT 2007: 439-447 |
| 2006 |
|---|
| 4 | | Stelios Neophytou,
Maria K. Michael,
Spyros Tragoudas:
Efficient Deterministic Test Generation for BIST Schemes with LFSR Reseeding.
IOLTS 2006: 43-50 |
| 3 | | Stelios Neophytou,
Maria K. Michael,
Spyros Tragoudas:
Functions for Quality Transition-Fault Tests and Their Applications in Test-Set Enhancement.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(12): 3026-3035 (2006) |
| 2005 |
|---|
| 2 | | Stelios Neophytou,
Maria K. Michael,
Spyros Tragoudas:
Test set enhancement for quality transition faults using function-based methods.
ACM Great Lakes Symposium on VLSI 2005: 182-187 |
| 1 | | Maria K. Michael,
Stelios Neophytou,
Spyros Tragoudas:
Functions for Quality Transition Fault Tests.
ISQED 2005: 327-332 |
Data released under the ODC-BY 1.0 license — See also our legal information page