Sani R. Nassif

	2012
114		Vijay Janapa Reddi, David Z. Pan, Sani R. Nassif, Keith A. Bowman: Robust and resilient designs from the bottom-up: Technology, CAD, circuit, and system issues. ASP-DAC 2012: 7-16
113		Rouwaida Kanj, Rajiv V. Joshi, Zhuo Li, Jerry Hayes, Sani R. Nassif: Yield estimation via multi-cones. DAC 2012: 1107-1112
112		Shayak Banerjee, Kanak B. Agarwal, Sani R. Nassif: Design-aware lithography. ISPD 2012: 3-8
	2011
111		Eun Jung Jang, Jaeyong Chung, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham: Post-Silicon Timing Validation Method Using Path Delay Measurements. Asian Test Symposium 2011: 232-237
110		Shayak Banerjee, Kanak B. Agarwal, Sani R. Nassif: Electrically-driven retargeting for nanoscale layouts. CICC 2011: 1-4
109		Rani S. Ghaida, Kanak B. Agarwal, Sani R. Nassif, Xin Yuan, Lars Liebmann, Puneet Gupta: A framework for double patterning-enabled design. ICCAD 2011: 14-20
108		Rouwaida Kanj, Tong Li, Rajiv V. Joshi, Kanak Agarwal, Ali Sadigh, David Winston, Sani R. Nassif: Accelerated statistical simulation via on-demand Hermite spline interpolations. ICCAD 2011: 353-360
107		Zhuo Li, Raju Balasubramanian, Frank Liu, Sani R. Nassif: 2011 TAU power grid simulation contest: Benchmark suite and results. ICCAD 2011: 478-481
106		Mehrdad Majzoobi, Golsa Ghiaasi, Farinaz Koushanfar, Sani R. Nassif: Ultra-low power current-based PUF. ISCAS 2011: 2071-2074
105		Shayak Banerjee, Kanak B. Agarwal, Sani R. Nassif, James A. Culp, Lars Liebmann, Michael Orshansky: Coupling timing objectives with optical proximity correction for improved timing yield. ISQED 2011: 97-102
104		Eun Jung Jang, Anne E. Gattiker, Sani R. Nassif, Jacob A. Abraham: Efficient and product-representative timing model validation. VTS 2011: 90-95
103		Xiaoji Ye, Wei Dong, Peng Li, Sani R. Nassif: Hierarchical Multialgorithm Parallel Circuit Simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 30(1): 45-58 (2011)
102		Chin-Hsiung Hsu, Yao-Wen Chang, Sani R. Nassif: Simultaneous Layout Migration and Decomposition for Double Patterning Technology. IEEE Trans. on CAD of Integrated Circuits and Systems 30(2): 284-294 (2011)
101		Jente B. Kuang, Jeremy D. Schaub, Fadi H. Gebara, Dieter F. Wendel, Thomas Fröhnel, Sudesh Saroop, Sani R. Nassif, Kevin J. Nowka: The Design and Characterization of a Half-Volt 32 nm Dual-Read 6T SRAM. IEEE Trans. on Circuits and Systems 58-I(9): 2010-2016 (2011)
100		Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif: The Impact of Statistical Leakage Models on Design Yield Estimation. VLSI Design 2011: (2011)
	2010
99		Sani R. Nassif: The light at the end of the CMOS tunnel. ASAP 2010: 4-9
98		Jente B. Kuang, Jeremy D. Schaub, Fadi H. Gebara, Dieter F. Wendel, Sudesh Saroop, Tuyet Nguyen, Thomas Fröhnel, Antje Müller, Christopher M. Durham, Rolf Sautter, Bryan Lloyd, Bryan J. Robbins, Juergen Pille, Sani R. Nassif, Kevin J. Nowka: A 32nm 0.5V-supply dual-read 6T SRAM. CICC 2010: 1-4
97		Sani R. Nassif, Nikil Mehta, Yu Cao: A resilience roadmap. DATE 2010: 1011-1016
96		Shayak Banerjee, Kanak B. Agarwal, Chin-Ngai Sze, Sani R. Nassif, Michael Orshansky: A methodology for propagating design tolerances to shape tolerances for use in manufacturing. DATE 2010: 1273-1278
95		Chin-Hsiung Hsu, Yao-Wen Chang, Sani R. Nassif: Template-mask design methodology for double patterning technology. ICCAD 2010: 107-111
94		Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif: Statistical leakage modeling for accurate yield analysis: the CDF matching method and its alternatives. ISLPED 2010: 337-342
93		Sani R. Nassif, Kevin J. Nowka: Physical design challenges beyond the 22nm node. ISPD 2010: 13-14
92		Sani R. Nassif: 'Tis the gift to be simple. IEEE Design & Test of Computers 27(2): 84-86 (2010)
91		Ritu Singhal, Asha Balijepalli, Anupama R. Subramaniam, Chi-Chao Wang, Frank Liu, Sani R. Nassif, Yu Cao: Modeling and Analysis of the Nonrectangular Gate Effect for Postlithography Circuit Simulation. IEEE Trans. VLSI Syst. 18(4): 666-670 (2010)
	2009
90		Sherief Reda, Sani R. Nassif: Analyzing the impact of process variations on parametric measurements: Novel models and applications. DATE 2009: 375-380
89		Rouwaida Kanj, Rajiv V. Joshi, Chad Adams, James Warnock, Sani R. Nassif: An elegant hardware-corroborated statistical repair and test methodology for conquering aging effects. ICCAD 2009: 497-504
88		Chin-Hsiung Hsu, Yao-Wen Chang, Sani R. Nassif: Simultaneous layout migration and decomposition for double patterning technology. ICCAD 2009: 595-600
87		Aditya Bansal, Rama N. Singh, Rouwaida Kanj, Saibal Mukhopadhyay, Jin-Fuw Lee, Emrah Acar, Amith Singhee, Keunwoo Kim, Ching-Te Chuang, Sani R. Nassif, Fook-Luen Heng, Koushik K. Das: Yield estimation of SRAM circuits using "Virtual SRAM Fab". ICCAD 2009: 631-636
86		Rouwaida Kanj, Rajiv V. Joshi, Jente B. Kuang, J. Kim, Mesut Meterelliyoz, William R. Reohr, Sani R. Nassif, Kevin J. Nowka: Statistical yield analysis of silicon-on-insulator embedded DRAM. ISQED 2009: 190-194
85		Ying Zhou, Rouwaida Kanj, Kanak Agarwal, Zhuo Li, Rajiv V. Joshi, Sani R. Nassif, Weiping Shi: The impact of BEOL lithography effects on the SRAM cell performance and yield. ISQED 2009: 607-612
	2008
84		Sani R. Nassif, Jaijeet S. Roychowdhury: 2008 International Conference on Computer-Aided Design (ICCAD'08), November 10-13, 2008, San Jose, CA, USA IEEE 2008
83		Sani R. Nassif: Technology modeling and characterization beyond the 45nm node. ASP-DAC 2008: 219
82		Sani R. Nassif: Power grid analysis benchmarks. ASP-DAC 2008: 376-381
81		Rajeshwary Tayade, Sani R. Nassif, Jacob A. Abraham: Analytical model for the impact of multiple input switching noise on timing. ASP-DAC 2008: 514-517
80		Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao: Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness. DAC 2008: 900-905
79		Diana Marculescu, Sani R. Nassif: Design Variability: Challenges and Solutions at Microarchitecture-Architecture Level. DATE 2008
78		Xiaoji Ye, Wei Dong, Peng Li, Sani R. Nassif: MAPS: multi-algorithm parallel circuit simulation. ICCAD 2008: 73-78
77		Rouwaida Kanj, Rajiv V. Joshi, Zhou Li, Jente B. Kuang, Hung C. Ngo, Ying Zhou, Weiping Shi, Sani R. Nassif: SRAM methodology for yield and power efficiency: per-element selectable supplies and memory reconfiguration schemes. ISLPED 2008: 87-92
76		Rouwaida Kanj, Rajiv V. Joshi, Keunwoo Kim, Richard Williams, Sani R. Nassif: Statistical Evaluation of Split Gate Opportunities for Improved 8T/6T Column-Decoupled SRAM Cell Yield. ISQED 2008: 702-707
75		Victoria Wang, Kanak Agarwal, Sani R. Nassif, Kevin J. Nowka, Dejan Markovic: A Design Model for Random Process Variability. ISQED 2008: 734-737
74		Rouwaida Kanj, Zhuo Li, Rajiv V. Joshi, Frank Liu, Sani R. Nassif: A Root-Finding Method for Assessing SRAM Stability. ISQED 2008: 804-809
73		Sani R. Nassif: Model to Hardware Matching for nm Scale Technologies. PATMOS 2008: 459
72		Fadi J. Kurdahi, Nikil Dutt, Ahmed M. Eltawil, Sani R. Nassif: Cross-Layer Approaches to Designing Reliable Systems Using Unreliable Chips. VLSI Design 2008: 14-15
71		Kanak Agarwal, Sani R. Nassif: The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies. IEEE Trans. VLSI Syst. 16(1): 86-97 (2008)
	2007
70		Rajeshwary Tayade, Vijay Kiran Kalyanam, Sani R. Nassif, Michael Orshansky, Jacob A. Abraham: Estimating path delay distribution considering coupling noise. ACM Great Lakes Symposium on VLSI 2007: 61-66
69		Anand Ramalingam, Ashish Kumar Singh, Sani R. Nassif, Michael Orshansky, David Z. Pan: Accurate Waveform Modeling using Singular Value Decomposition with Applications to Timing Analysis. DAC 2007: 148-153
68		Kanak Agarwal, Sani R. Nassif: Characterizing Process Variation in Nanometer CMOS. DAC 2007: 396-399
67		Ritu Singhal, Asha Balijepalli, Anupama R. Subramaniam, Frank Liu, Sani R. Nassif, Yu Cao: Modeling and Analysis of Non-Rectangular Gate for Post-Lithography Circuit Simulation. DAC 2007: 823-828
66		Rouwaida Kanj, Rajiv V. Joshi, Jayakumaran Sivagnaname, Jente B. Kuang, Dhruva Acharyya, Tuyet Nguyen, Chandler McDowell, Sani R. Nassif: Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs. ISQED 2007: 33-40
65		Peng Li, Frank Liu, Xin Li, Lawrence T. Pileggi, Sani R. Nassif: Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction CoRR abs/0710.4654: (2007)
	2006
64		Sani R. Nassif, Vijay Pitchumani, N. Rodriguez, Dennis Sylvester, Clive Bittlestone, Riko Radojcic: Variation-aware analysis: savior of the nanometer era? DAC 2006: 411-412
63		Kanak Agarwal, Sani R. Nassif: Statistical analysis of SRAM cell stability. DAC 2006: 57-62
62		Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif: Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events. DAC 2006: 69-72
61		Anand Ramalingam, Gi-Joon Nam, Ashish Kumar Singh, Michael Orshansky, Sani R. Nassif, David Z. Pan: An accurate sparse matrix based framework for statistical static timing analysis. ICCAD 2006: 231-236
60		Bin Zhang, Ari Arapostathis, Sani R. Nassif, Michael Orshansky: Analytical modeling of SRAM dynamic stability. ICCAD 2006: 315-322
59		Emrah Acar, Kanak Agarwal, Sani R. Nassif: Characterization of total chip leakage using inverse (reciprocal) gamma distribution. ISCAS 2006
58		Sani R. Nassif, Kanak Agarwal, Emrah Acar: Methods for estimating decoupling capacitance of nonswitching circuit blocks. ISCAS 2006
57		Sani R. Nassif: Model to hardware matching: for nano-meter scale technologies. ISLPED 2006: 203-206
56		Fadi J. Kurdahi, Ahmed M. Eltawil, Young-Hwan Park, Rouwaida Kanj, Sani R. Nassif: System-Level SRAM Yield Enhancement. ISQED 2006: 179-184
55		Praveen Elakkumanan, Jente B. Kuang, Kevin J. Nowka, Ramalingam Sridhar, Rouwaida Kanj, Sani R. Nassif: SRAM Local Bit Line Access Failure Analyses. ISQED 2006: 204-209
54		Anand Ramalingam, David Z. Pan, Frank Liu, Sani R. Nassif: Accurate Thermal Analysis Considering Nonlinear Thermal Conductivity. ISQED 2006: 644-649
53		Kerry Bernstein, David J. Frank, Anne E. Gattiker, Wilfried Haensch, Brian L. Ji, Sani R. Nassif, Edward J. Nowak, Dale J. Pearson, Norman J. Rohrer: High-performance CMOS variability in the 65-nm regime and beyond. IBM Journal of Research and Development 50(4-5): 433-450 (2006)
52		T. M. Mak, Sani R. Nassif: Guest Editors' Introduction: Process Variation and Stochastic Design and Test. IEEE Design & Test of Computers 23(6): 436-437 (2006)
	2005
51		Sani R. Nassif, Paul S. Zuchowski, Claude Moughanni, Mohamed Moosa, Stephen D. Posluszny, Ward Vercruysse: The Titanic: what went wrong! DAC 2005: 349-350
50		Peng Li, Frank Liu, Xin Li, Lawrence T. Pileggi, Sani R. Nassif: Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction. DATE 2005: 958-963
49		Hailin Jiang, Malgorzata Marek-Sadowska, Sani R. Nassif: Benefits and Costs of Power-Gating Technique. ICCD 2005: 559-566
48		Rahul M. Rao, Kanak Agarwal, Dennis Sylvester, Himanshu Kaul, Richard B. Brown, Sani R. Nassif: Power-aware global signaling strategies. ISCAS (1) 2005: 604-607
47		Rajeev R. Rao, David Blaauw, Dennis Sylvester, Charles J. Alpert, Sani R. Nassif: An efficient surface-based low-power buffer insertion algorithm. ISPD 2005: 86-93
46		Sani R. Nassif, Zhuo Li: A More Effective CEFF. ISQED 2005: 648-653
45		Ramyanshu Datta, Sani R. Nassif, Robert K. Montoye, Jacob A. Abraham: Testing and debugging delay faults in dynamic circuits. ITC 2005: 10
44		Anirudh Devgan, Sani R. Nassif: Power Variability and Its Impact on Design. VLSI Design 2005: 679-682
43		Haifeng Qian, Sani R. Nassif, Sachin S. Sapatnekar: Early-stage power grid analysis for uncertain working modes. IEEE Trans. on CAD of Integrated Circuits and Systems 24(5): 676-682 (2005)
42		Haifeng Qian, Sani R. Nassif, Sachin S. Sapatnekar: Power grid analysis using random walks. IEEE Trans. on CAD of Integrated Circuits and Systems 24(8): 1204-1224 (2005)
41		Emrah Acar, Anirudh Devgan, Sani R. Nassif: Leakage and Leakage Sensitivity Computation for Combinational Circuits. J. Low Power Electronics 1(2): 172-181 (2005)
	2004
40		Kanak Agarwal, Dennis Sylvester, David Blaauw, Frank Liu, Sani R. Nassif, Sarma B. K. Vrudhula: Variational delay metrics for interconnect timing analysis. DAC 2004: 381-384
39		Sani R. Nassif, Duane S. Boning, Nagib Hakim: The care and feeding of your statistical static timer. ICCAD 2004: 138-139
38		Haifeng Qian, Joseph N. Kozhaya, Sani R. Nassif, Sachin S. Sapatnekar: A chip-level electrostatic discharge simulation strategy. ICCAD 2004: 315-318
37		Rahul M. Rao, Kanak Agarwal, Dennis Sylvester, Richard B. Brown, Kevin J. Nowka, Sani R. Nassif: Approaches to run-time and standby mode leakage reduction in global buses. ISLPED 2004: 188-193
36		Sani R. Nassif: The impact of variability on power. ISLPED 2004: 350
35		Haifeng Qian, Sani R. Nassif, Sachin S. Sapatnekar: Early-stage power grid analysis for uncertain working modes. ISPD 2004: 132-137
34		Juan Antonio Carballo, Sani R. Nassif: Impact of Design-Manufacturing Interface on SoC Design Methodologies. IEEE Design & Test of Computers 21(3): 183-191 (2004)
33		Haihua Su, Jiang Hu, Sachin S. Sapatnekar, Sani R. Nassif: A methodology for the simultaneous design of supply and signal networks. IEEE Trans. on CAD of Integrated Circuits and Systems 23(12): 1614-1624 (2004)
	2003
32		Haihua Su, Emrah Acar, Sani R. Nassif: Power grid reduction based on algebraic multigrid principles. DAC 2003: 109-112
31		Haifeng Qian, Sani R. Nassif, Sachin S. Sapatnekar: Random walks in a supply network. DAC 2003: 93-98
30		Haihua Su, Frank Liu, Anirudh Devgan, Emrah Acar, Sani R. Nassif: Full chip leakage estimation considering power supply and temperature variations. ISLPED 2003: 78-83
29		Emrah Acar, Anirudh Devgan, Rahul M. Rao, Ying Liu, Haihua Su, Sani R. Nassif, Jeffrey L. Burns: Leakage and leakage sensitivity computation for combinational circuits. ISLPED 2003: 96-99
28		Ravishankar Arunachalam, Emrah Acar, Sani R. Nassif: Optimal shielding/spacing metrics for low power design. ISVLSI 2003: 167-172
27		Sani R. Nassif, Soha Hassoun: Guest Editors' Introduction: On-Chip Power Distribution Networks. IEEE Design & Test of Computers 20(3): 5-6 (2003)
26		Haihua Su, Sachin S. Sapatnekar, Sani R. Nassif: Optimal decoupling capacitor sizing and placement for standard-cell layout designs. IEEE Trans. on CAD of Integrated Circuits and Systems 22(4): 428-436 (2003)
	2002
25		Haihua Su, Jiang Hu, Sachin S. Sapatnekar, Sani R. Nassif: Congestion-driven codesign of power and signal networks. DAC 2002: 64-69
24		Emrah Acar, Sani R. Nassif, Lawrence T. Pileggi: A Linear-Centric Simulation Framework for Parametric Fluctuations. DATE 2002: 568-575
23		Anne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long: Static timing analysis based circuit-limited-yield estimation. ISCAS (5) 2002: 81-84
22		Haihua Su, Sachin S. Sapatnekar, Sani R. Nassif: An algorithm for optimal decoupling capacitor sizing and placement for standard cell layouts. ISPD 2002: 68-73
21		Emrah Acar, Sani R. Nassif, Ying Liu, Lawrence T. Pileggi: Time-Domain Simulation of Variational Interconnect Models. ISQED 2002: 419-424
20		Juan Antonio Carballo, Sani R. Nassif: Impact of Technology in Power-Grid-Induced Noise. PATMOS 2002: 45-54
19		Sani R. Nassif, Onsi Fakhouri: Technology trends in power-grid-induced noise. SLIP 2002: 55-59
18		Duane S. Boning, Joseph Panganiban, Karen Gonzalez-Valentin, Sani R. Nassif, Chandler McDowell, Anne E. Gattiker, Frank Liu: Test structures for delay variability. Timing Issues in the Specification and Synthesis of Digital Systems 2002: 109
17		Joseph N. Kozhaya, Sani R. Nassif, Farid N. Najm: A multigrid-like technique for power grid analysis. IEEE Trans. on CAD of Integrated Circuits and Systems 21(10): 1148-1160 (2002)
	2001
16		Sani R. Nassif: Modeling and forecasting of manufacturing variations (embedded tutorial). ASP-DAC 2001: 145-150
15		Hidetoshi Onodera, Andrew B. Kahng, Wayne Wei-Ming Dai, Sani R. Nassif, Juho Kim, Akira Tanabe, Toshihiro Hattori: Beyond the red brick wall (panel): challenges and solutions in 50nm physical design. ASP-DAC 2001: 267-268
14		Joseph N. Kozhaya, Sani R. Nassif, Farid N. Najm: Multigrid-Like Technique for Power Grid Analysis. ICCAD 2001: 480-487
13		Emrah Acar, Lawrence T. Pileggi, Sani R. Nassif, Ying Liu: Assessment of True Worst Case Circuit Performance Under Interconnect Parameter Variations. ISQED 2001: 431-436
12		Anne E. Gattiker, Sani R. Nassif, Rashmi Dinakar, Chris Long: Timing Yield Estimation from Static Timing Analysis. ISQED 2001: 437-442
	2000
11		Sani R. Nassif, Joseph N. Kozhaya: Fast power grid simulation. DAC 2000: 156-161
10		Ying Liu, Sani R. Nassif, Lawrence T. Pileggi, Andrzej J. Strojwas: Impact of interconnect variations on the clock skew of a gigahertz microprocessor. DAC 2000: 168-171
9		Vikas Mehrotra, Shiou Lin Sam, Duane S. Boning, Anantha Chandrakasan, Rakesh Vallishayee, Sani R. Nassif: A methodology for modeling the effects of systematic within-die interconnect and device variation on circuit performance. DAC 2000: 172-175
8		N. S. Nagaraj, Andrzej J. Strojwas, Sani R. Nassif, Ray Hokinson, Tak Young, Wonjae L. Kang, David Overhauser, Sung-Mo Kang: When bad things happen to good chips (panel session). DAC 2000: 736-737
7		Sani R. Nassif: Designing Closer to the Edge. DATE 2000: 636-637
6		Sani R. Nassif: Design for Variability in DSM Technologies. ISQED 2000: 451-454
	1999
5		Sani R. Nassif, Tuyen V. Nguyen: SOI technology and tools (abstract). ICCAD 1999: 459
	1997
4		David P. LaPotin, Uttam Ghoshal, Eli Chiprout, Sani R. Nassif: Physical design challenges for performance. ISPD 1997: 225-226
	1986
3		Luís M. Vidigal, Sani R. Nassif, Stephen W. Director: CINNAMON: coupled integration and nodal analysis of MOS networks. DAC 1986: 179-185
2		Sani R. Nassif, Andrzej J. Strojwas, Stephen W. Director: A Methodology for Worst-Case Analysis of Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 5(1): 104-113 (1986)
	1984
1		Sani R. Nassif, Andrzej J. Strojwas, Stephen W. Director: FABRICS II: A Statistically Based IC Fabrication Process Simulator. IEEE Trans. on CAD of Integrated Circuits and Systems 3(1): 40-46 (1984)

Coauthor Index

1	Jacob A. Abraham	[45] [70] [81] [104] [111]
2	Emrah Acar	[13] [21] [24] [28] [29] [30] [32] [41] [58] [59] [87]
3	Dhruva Acharyya	[66]
4	Chad Adams	[89]
5	Kanak Agarwal	[37] [40] [48] [58] [59] [63] [68] [71] [75] [85] [108]
6	Kanak B. Agarwal	[96] [105] [109] [110] [112]
7	Charles J. Alpert	[47]
8	Ari Arapostathis (Aristotle Arapostathis)	[60]
9	Ravishankar Arunachalam	[28]
10	Raju Balasubramanian	[107]
11	Asha Balijepalli	[67] [91]
12	Shayak Banerjee	[96] [105] [110] [112]
13	Aditya Bansal	[87]
14	Kerry Bernstein	[53]
15	Clive Bittlestone	[64]
16	David Blaauw (David T. Blaauw)	[40] [47]
17	Duane S. Boning	[9] [18] [39]
18	Keith A. Bowman	[114]
19	Richard B. Brown	[37] [48]
20	Jeffrey L. Burns	[29]
21	Yu Cao	[67] [80] [91] [97]
22	Juan Antonio Carballo	[20] [34]
23	Anantha Chandrakasan (Anantha P. Chandrakasan)	[9]
24	Yao-Wen Chang	[88] [95] [102]
25	Eli Chiprout	[4]
26	Ching-Te Chuang	[87]
27	Jaeyong Chung	[111]
28	James A. Culp	[105]
29	Wayne Wei-Ming Dai	[15]
30	Koushik K. Das	[87]
31	Ramyanshu Datta	[45]
32	Anirudh Devgan	[29] [30] [41] [44]
33	Rashmi Dinakar	[12] [23]
34	Stephen W. Director	[1] [2] [3]
35	Wei Dong	[78] [103]
36	Christopher M. Durham	[98]
37	Nikil D. Dutt (Nikil Dutt)	[72]
38	Praveen Elakkumanan	[55]
39	Ahmed M. Eltawil	[56] [72]
40	Onsi Fakhouri	[19]
41	David J. Frank	[53]
42	Thomas Fröhnel	[98] [101]
43	Anne E. Gattiker (Anne Gattiker)	[12] [18] [23] [53] [104] [111]
44	Fadi H. Gebara	[98] [101]
45	Rani S. Ghaida	[109]
46	Golsa Ghiaasi	[106]
47	Uttam Ghoshal	[4]
48	Karen Gonzalez-Valentin	[18]
49	Puneet Gupta	[109]
50	Wilfried Haensch	[53]
51	Nagib Hakim	[39]
52	Soha Hassoun	[27]
53	Toshihiro Hattori	[15]
54	Jerry Hayes	[113]
55	Fook-Luen Heng	[87]
56	Ray Hokinson	[8]
57	Chin-Hsiung Hsu	[88] [95] [102]
58	Jiang Hu	[25] [33]
59	Eun Jung Jang	[104] [111]
60	Brian L. Ji	[53]
61	Hailin Jiang	[49]
62	Rajiv V. Joshi	[62] [66] [74] [76] [77] [85] [86] [89] [94] [100] [108] [113]
63	Andrew B. Kahng	[15]
64	Vijay Kiran Kalyanam	[70]
65	Sung-Mo Kang	[8]
66	Wonjae L. Kang	[8]
67	Rouwaida Kanj	[55] [56] [62] [66] [74] [76] [77] [85] [86] [87] [89] [94] [100] [108] [113]
68	Himanshu Kaul	[48]
69	J. Kim	[86]
70	Juho Kim	[15]
71	Keunwoo Kim	[76] [87]
72	Farinaz Koushanfar	[106]
73	Joseph N. Kozhaya	[11] [14] [17] [38]
74	Jente B. Kuang	[55] [66] [77] [86] [98] [101]
75	Fadi J. Kurdahi	[56] [72]
76	David P. LaPotin	[4]
77	Jin-Fuw Lee	[87]
78	Peng Li	[50] [65] [78] [103]
79	Tong Li	[108]
80	Xin Li	[50] [65]
81	Zhou Li	[77]
82	Zhuo Li	[46] [74] [85] [107] [113]
83	Lars Liebmann	[105] [109]
84	Frank Liu	[18] [30] [40] [50] [54] [65] [67] [74] [80] [91] [107]
85	Ying Liu	[10] [13] [21] [29]
86	Bryan Lloyd	[98]
87	Chris Long	[12] [23]
88	Mehrdad Majzoobi	[106]
89	T. M. Mak	[52]
90	Diana Marculescu	[79]
91	Malgorzata Marek-Sadowska	[49]
92	Dejan Markovic	[75]
93	Chandler McDowell	[18] [66]
94	Vikas Mehrotra	[9]
95	Nikil Mehta	[97]
96	Mesut Meterelliyoz	[86]
97	Robert K. Montoye	[45]
98	Mohamed Moosa	[51]
99	Claude Moughanni	[51]
100	Saibal Mukhopadhyay	[87]
101	Antje Müller	[98]
102	N. S. Nagaraj	[8]
103	Farid N. Najm	[14] [17]
104	Gi-Joon Nam	[61]
105	Hung C. Ngo	[77]
106	Tuyen V. Nguyen	[5]
107	Tuyet Nguyen	[66] [98]
108	Edward J. Nowak	[53]
109	Kevin J. Nowka	[37] [55] [75] [86] [93] [98] [101]
110	Hidetoshi Onodera	[15]
111	Michael Orshansky	[60] [61] [69] [70] [96] [105]
112	David Overhauser	[8]
113	David Z. Pan (David Zhigang Pan)	[54] [61] [69] [114]
114	Joseph Panganiban	[18]
115	Young-Hwan Park	[56]
116	Dale J. Pearson	[53]
117	Lawrence T. Pileggi (Larry T. Pileggi, Lawrence T. Pillage)	[10] [13] [21] [24] [50] [65]
118	Juergen Pille (Jürgen Pille)	[98]
119	Vijay Pitchumani	[64]
120	Stephen D. Posluszny	[51]
121	Haifeng Qian	[31] [35] [38] [42] [43]
122	Riko Radojcic	[64]
123	Anand Ramalingam	[54] [61] [69]
124	Rahul M. Rao	[29] [37] [48]
125	Rajeev R. Rao	[47]
126	Sherief Reda	[90]
127	Vijay Janapa Reddi	[114]
128	William R. Reohr	[86]
129	Bryan J. Robbins	[98]
130	N. Rodriguez	[64]
131	Norman J. Rohrer	[53]
132	Jaijeet S. Roychowdhury	[84]
133	Ali Sadigh	[108]
134	Shiou Lin Sam	[9]
135	Sachin S. Sapatnekar	[22] [25] [26] [31] [33] [35] [38] [42] [43]
136	Sudesh Saroop	[98] [101]
137	Rolf Sautter	[98]
138	Jeremy D. Schaub	[98] [101]
139	Weiping Shi	[77] [85]
140	Ashish Kumar Singh	[61] [69]
141	Rama N. Singh	[87]
142	Ritu Singhal	[67] [91]
143	Amith Singhee	[87]
144	Jayakumaran Sivagnaname	[66]
145	Ramalingam Sridhar	[55]
146	Andrzej J. Strojwas (Andreas J. Strojwas)	[1] [2] [8] [10]
147	Haihua Su	[22] [25] [26] [29] [30] [32] [33]
148	Anupama R. Subramaniam	[67] [91]
149	Dennis Sylvester	[37] [40] [47] [48] [64]
150	Chin-Ngai Sze	[96]
151	Akira Tanabe	[15]
152	Rajeshwary Tayade	[70] [81]
153	Rakesh Vallishayee	[9]
154	Ward Vercruysse	[51]
155	Luís M. Vidigal	[3]
156	Sarma B. K. Vrudhula	[40]
157	Chi-Chao Wang	[91]
158	Victoria Wang	[75]
159	James Warnock	[89]
160	Dieter F. Wendel	[98] [101]
161	Richard Williams	[76]
162	David Winston	[108]
163	Xiaoji Ye	[78] [103]
164	Yun Ye	[80]
165	Tak Young	[8]
166	Xin Yuan	[109]
167	Bin Zhang	[60]
168	Ying Zhou	[77] [85]
169	Paul S. Zuchowski	[51]

Colors in the list of coauthors

Last update Sun Jun 3 16:06:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page