Riaz Naseer

	2007
3		Riaz Naseer, Jeff Draper, Younes Boulghassoul, Sandeepan DasGupta, Art Witulski: Critical charge and set pulse widths for combinational logic in commercial 90nm cmos technology. ACM Great Lakes Symposium on VLSI 2007: 227-230
2		Riaz Naseer, Younes Boulghassoul, Jeff Draper, Sandeepan DasGupta, Art Witulski: Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM. ISCAS 2007: 1879-1882
	2006
1		Riaz Naseer, Jeff Draper: DF-DICE: a scalable solution for soft error tolerant circuit design. ISCAS 2006

Coauthor Index

1	Younes Boulghassoul	[2] [3]
2	Sandeepan DasGupta	[2] [3]
3	Jeffrey T. Draper (Jeff Draper)	[1] [2] [3]
4	Art Witulski	[2] [3]

Last update Sun Jun 3 16:06:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page