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Naveena Nagi Coauthor index pubzone.org

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DBLP keys1999
15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLStephen K. Sunter, Naveena Nagi: Test Metrics for Analog Parametric Faults. VTS 1999: 226-235
1998
14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHeebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi: Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits. VTS 1998: 145-151
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLNaveena Nagi, Abhijit Chatterjee, Heebyung Yoon, Jacob A. Abraham: Signature analysis for analog and mixed-signal circuit test response compaction. IEEE Trans. on CAD of Integrated Circuits and Systems 17(6): 540-546 (1998)
1997
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLStephen K. Sunter, Naveena Nagi: A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST. ITC 1997: 389-395
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAbhijit Chatterjee, Naveena Nagi: Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial. VLSI Design 1997: 388-392
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi: Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling. VTS 1997: 261-266
1996
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAbhijit Chatterjee, Bruce C. Kim, Naveena Nagi: Low-cost DC built-in self-test of linear analog circuits using checksums. VLSI Design 1996: 230-233
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAbhijit Chatterjee, Bruce C. Kim, Naveena Nagi: DC Built-In Self-Test for Linear Analog Circuits. IEEE Design & Test of Computers 13(2): 26-33 (1996)
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAshok Balivada, Hong Zheng, Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham: A unified approach for fault simulation of linear mixed-signal circuits. J. Electronic Testing 9(1-2): 29-41 (1996)
1995
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLNaveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham: Efficient multisine testing of analog circuits. VLSI Design 1995: 234-238
1994
5no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLNaveena Nagi, Abhijit Chatterjee, Jacob A. Abraham: A Signature Analyzer for Analog and Mixed-signal Circuits. ICCD 1994: 284-287
1993
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLNaveena Nagi, Abhijit Chatterjee, Jacob A. Abraham: DRAFTS: Discretized Analog Circuit Fault Simulator. DAC 1993: 509-514
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLNaveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham: Fault-based automatic test generator for linear analog circuits. ICCAD 1993: 88-91
2no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLNaveena Nagi, Abhijit Chatterjee, Jacob A. Abraham: MIXER: Mixed-Signal Fault Simulator. ICCD 1993: 568-571
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLNaveena Nagi, Abhijit Chatterjee, Jacob A. Abraham: Fault simulation of linear analog circuits. J. Electronic Testing 4(4): 345-360 (1993)

Coauthor Index

1Jacob A. Abraham [1] [2] [3] [4] [5] [6] [7] [13]
2Ashok Balivada [3] [6] [7]
3Abhijit Chatterjee [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [13] [14]
4Bruce C. Kim [8] [9]
5Stephen K. Sunter (Steve Sunter) [12] [15]
6Pramodchandran N. Variyam [10] [14]
7Heebyung Yoon [13] [14]
8Hong Zheng [7]

Colors in the list of coauthors

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