 | 2011 |
| 3 |  | Hendrik Purwins,
Ahmed Nagi,
Bernd Barak,
Uwe Hockele,
Andreas Kyek,
Benjamin Lenz,
Gunter Pfeifer,
Kurt Weinzierl:
Regression methods for prediction of PECVD Silicon Nitride layer thickness.
CASE 2011: 387-392 |
| 2008 |
| 2 |  | Alexander Y. Kreinin,
Ahmed Nagi:
Calibration of the default probability model.
European Journal of Operational Research 185(3): 1462-1476 (2008) |
| 2007 |
| 1 |  | Ben De Prisco,
Ian Iscoe,
Alexander Y. Kreinin,
Ahmed Nagi:
A semi-analytical method for VaR and credit exposure analysis.
Annals OR 152(1): 23-47 (2007) |