Hideki Murakami

	2012
9		Akio Ohta, Yuta Goto, Shingo Nishigaki, Guobin Wei, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki: Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering. IEICE Transactions 95-C(5): 879-884 (2012)
	2011
8		Guobin Wei, Yuta Goto, Akio Ohta, Katsunori Makihara, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki: Impact of Annealing Ambience on Resistive Switching in Pt/TiO2/Pt Structure. IEICE Transactions 94-C(5): 699-704 (2011)
7		Akio Ohta, Daisuke Kanme, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki: Characterization of Mg Diffusion into HfO2/SiO2/Si(100) Stacked Structures and Its Impact on Detect State Densities. IEICE Transactions 94-C(5): 717-723 (2011)
	2010
6		Hideki Murakami, Tim S. Yoon, Emad S. Attallah-Wasif, Chaiwat Kraiwattanapong, Ichiro Kikkawa, William C. Hutton: Quantitative differences in intervertebral disc-matrix composition with age-related degeneration. Med. Biol. Engineering and Computing 48(5): 469-474 (2010)
	2007
5		Yanli Pei, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki, Seiji Inumiya, Yasuo Nara: Evaluation of Dielectric Reliability of Ultrathin HfSiOxNy in Metal-Gate Capacitors. IEICE Transactions 90-C(5): 962-967 (2007)
	2005
4		Hideki Murakami, Wataru Mizubayashi, Hirokazu Yokoi, Atsushi Suyama, Seiichi Miyazaki: Electrical Characterization of Aluminum-Oxynitride Stacked Gate Dielectrics Prepared by a Layer-by-Layer Process of Chemical Vapor Deposition and Rapid Thermal Nitridation. IEICE Transactions 88-C(4): 640-645 (2005)
3		Hideki Murakami, Yoshikazu Moriwaki, Masafumi Fujitake, Daisuke Azuma, Seiichiro Higashi, Seiichi Miyazaki: Characterization of Atom Diffusion in Polycrystalline Si/SiGe/Si Stacked Gate. IEICE Transactions 88-C(4): 646-650 (2005)
2		Katsunori Makihara, Yoshihiro Okamoto, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki: Characterization of Germanium Nanocrystallites Grown on SiO2 by a Conductive AFM Probe Technique. IEICE Transactions 88-C(4): 705-708 (2005)
1		Taku Shibaguchi, Mitsuhisa Ikeda, Hideki Murakami, Seiichi Miyazaki: Charging and Discharging Characteristics of Stacked Floating Gates of Silicon Quantum Dots. IEICE Transactions 88-C(4): 709-712 (2005)

Coauthor Index

1	Emad S. Attallah-Wasif	[6]
2	Daisuke Azuma	[3]
3	Masafumi Fujitake	[3]
4	Yuta Goto	[8] [9]
5	Seiichiro Higashi	[2] [3] [5] [7] [8] [9]
6	William C. Hutton	[6]
7	Mitsuhisa Ikeda	[1]
8	Seiji Inumiya	[5]
9	Daisuke Kanme	[7]
10	Ichiro Kikkawa	[6]
11	Chaiwat Kraiwattanapong	[6]
12	Katsunori Makihara	[2] [8]
13	Seiichi Miyazaki	[1] [2] [3] [4] [5] [7] [8] [9]
14	Wataru Mizubayashi	[4]
15	Yoshikazu Moriwaki	[3]
16	Yasuo Nara	[5]
17	Shingo Nishigaki	[9]
18	Akio Ohta	[7] [8] [9]
19	Yoshihiro Okamoto	[2]
20	Yanli Pei	[5]
21	Taku Shibaguchi	[1]
22	Atsushi Suyama	[4]
23	Guobin Wei	[8] [9]
24	Hirokazu Yokoi	[4]
25	Tim S. Yoon	[6]

Colors in the list of coauthors

Last update Sun Jun 3 16:06:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page