G. Mura

Giovanna Mura

	2012
13		Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni: Chip and package-related degradation of high power white LEDs. Microelectronics Reliability 52(5): 804-812 (2012)
	2011
12		Massimo Vanzi, G. Mura, G. Martines: DC parameters for laser diodes from experimental curves. Microelectronics Reliability 51(9-11): 1752-1756 (2011)
	2010
11		G. Mura, Massimo Vanzi: The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis. Microelectronics Reliability 50(4): 471-478 (2010)
	2009
10		G. Mura, Massimo Vanzi: Lot reliability issues in commercial off the shelf (COTS) microelectronic devices. Microelectronics Reliability 49(9-11): 1196-1199 (2009)
	2008
9		G. Mura, G. Cassanelli, Fausto Fantini, Massimo Vanzi: Sulfur-contamination of high power white LED. Microelectronics Reliability 48(8-9): 1208-1211 (2008)
	2007
8		Matteo Meneghini, L. Trevisanello, C. Sanna, G. Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni: High temperature electro-optical degradation of InGaN/GaN HBLEDs. Microelectronics Reliability 47(9-11): 1625-1629 (2007)
	2006
7		G. Cassanelli, G. Mura, Fausto Fantini, Massimo Vanzi, B. Plano: Failure Analysis-assisted FMEA. Microelectronics Reliability 46(9-11): 1795-1799 (2006)
	2005
6		G. Cassanelli, G. Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini: Reliability predictions in electronic industrial applications. Microelectronics Reliability 45(9-11): 1321-1326 (2005)
	2003
5		Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, G. Scamarcio, G. Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich: Reliability of visible GaN LEDs in plastic package. Microelectronics Reliability 43(9-11): 1737-1742 (2003)
4		G. Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner: On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. Microelectronics Reliability 43(9-11): 1771-1776 (2003)
	2002
3		Gaudenzio Meneghesso, A. Cocco, G. Mura, Simona Podda, Massimo Vanzi: Backside Failure Analysis of GaAs ICs after ESD tests. Microelectronics Reliability 42(9-11): 1293-1298 (2002)
2		L. Sponton, L. Cerati, G. Croce, G. Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni: ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. Microelectronics Reliability 42(9-11): 1303-1306 (2002)
1		M. Giglio, G. Martines, G. Mura, Simona Podda, Massimo Vanzi: An automated lifetest equipment for optical emitters. Microelectronics Reliability 42(9-11): 1311-1315 (2002)

Coauthor Index

1	G. Cassanelli	[6] [7] [9]
2	L. Cerati	[2]
3	F. Cesaretti	[6]
4	Mauro Ciappa	[4]
5	A. Cocco	[3]
6	G. Croce	[2]
7	S. Du	[5]
8	I. Eliashevich	[5]
9	Fausto Fantini	[6] [7] [9]
10	Wolfgang Fichtner	[4]
11	M. Giglio	[1]
12	Matteo Dal Lago	[13]
13	S. Levada	[5]
14	G. Martines	[1] [12]
15	Gaudenzio Meneghesso	[2] [3] [5] [8] [13]
16	Matteo Meneghini	[8] [13]
17	B. Plano	[7]
18	Simona Podda	[1] [2] [3] [5]
19	C. Sanna	[8]
20	G. Scamarcio	[5]
21	L. Sponton	[2]
22	Maria Stangoni	[4]
23	L. Trevisanello	[8]
24	Nicola Trivellin	[13]
25	Massimo Vanzi	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13]
26	Enrico Zanoni	[2] [5] [8] [13]

Last update Sun Jun 3 16:06:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page