 | 2011 |
| 12 |  | Valentina Bianchi,
Ferdinando Grossi,
Ilaria De Munari,
Paolo Ciampolini:
MuSA: a multisensor wearable device for AAL.
FedCSIS 2011: 375-380 |
| 2009 |
| 11 |  | Andrea Ricci,
Ilaria De Munari,
Paolo Ciampolini:
Performance-Effective Compaction of Standard-Cell Libraries for Digital Design.
DSD 2009: 315-322 |
| 10 |  | Andrea Ricci,
Matteo Grisanti,
Ilaria De Munari,
Paolo Ciampolini:
Improved Pervasive Sensing With RFID: An Ultra-Low Power Baseband Processor for UHF Tags.
IEEE Trans. VLSI Syst. 17(12): 1719-1729 (2009) |
| 2008 |
| 9 |  | Valentina Bianchi,
Ferdinando Grossi,
Guido Matrella,
Ilaria De Munari,
Paolo Ciampolini:
A Wireless Sensor Platform for Assistive Technology Applications.
DSD 2008: 809-816 |
| 8 |  | Andrea Ricci,
Matteo Grisanti,
Ilaria De Munari,
Paolo Ciampolini:
Design of an Ultra Low-Power RFID Baseband Processor Featuring an AES Cryptography Engine.
DSD 2008: 831-838 |
| 2007 |
| 7 |  | Andrea Ricci,
Ilaria De Munari,
Paolo Ciampolini:
An evolutionary approach for standard-cell library reduction.
ACM Great Lakes Symposium on VLSI 2007: 305-310 |
| 6 |  | Andrea Ricci,
Ilaria De Munari:
Enabling Pervasive Sensing with RFID: An Ultra Low-Power Digital Core for UHF Transponders.
ISCAS 2007: 1589-1592 |
| 5 |  | Alessandro Marras,
M. Impronta,
Ilaria De Munari,
M. G. Valentini,
A. Scorzoni:
Reliability assessment of multi-via Cu-damascene structures by wafer-level isothermal electromigration tests.
Microelectronics Reliability 47(9-11): 1492-1496 (2007) |
| 2006 |
| 4 |  | Andrea Ricci,
Matteo Grisanti,
Ilaria De Munari,
Paolo Ciampolini:
Design of a Low-Power Digital Core for Passive UHF RFID Transponder.
DSD 2006: 561-568 |
| 2005 |
| 3 |  | Alessandro Marras,
Ilaria De Munari,
Davide Vescovi,
Paolo Ciampolini:
Impact of gate-leakage currents on CMOS circuit performance.
Microelectronics Reliability 45(3-4): 499-506 (2005) |
| 2002 |
| 2 |  | T. Tomasi,
Ilaria De Munari,
V. Lista,
L. Gherardi,
A. Righetti,
M. Villa:
Passive optical components: from degradation data to reliability assessment - preliminary results.
Microelectronics Reliability 42(9-11): 1333-1338 (2002) |
| 1 |  | C. Caprile,
Ilaria De Munari,
M. Impronta,
Simona Podda,
A. Scorzoni,
Massimo Vanzi:
A specimen-current branching approach for FA of long Electromigration test lines.
Microelectronics Reliability 42(9-11): 1715-1718 (2002) |