 | 2012 |
| 24 |  | Debjit Pal,
Pallab Dasgupta,
Siddhartha Mukhopadhyay:
A Library for Passive Online Verification of Analog and Mixed-Signal Circuits.
VLSI Design 2012: 364-369 |
| 2011 |
| 23 |  | Arnab Khawas,
Siddhartha Mukhopadhyay:
A Design of Experiment Based Approach to Variance Optimal Design of CMOS OpAmp.
ISVLSI 2011: 325-326 |
| 22 |  | Arnab Khawas,
Amitava Banerjee,
Siddhartha Mukhopadhyay:
A Response Surface Method for Design Space Exploration and Optimization of Analog Circuits.
ISVLSI 2011: 84-89 |
| 21 |  | Antara Ain,
Debjit Pal,
Pallab Dasgupta,
Siddhartha Mukhopadhyay,
Rajdeep Mukhopadhyay,
John Gough:
Chassis: A Platform for Verifying PMU Integration Using Autogenerated Behavioral Models.
ACM Trans. Design Autom. Electr. Syst. 16(3): 33 (2011) |
| 20 |  | Subhankar Mukherjee,
Pallab Dasgupta,
Siddhartha Mukhopadhyay:
Auxiliary Specifications for Context-Sensitive Monitoring of AMS Assertions.
IEEE Trans. on CAD of Integrated Circuits and Systems 30(10): 1446-1457 (2011) |
| 2010 |
| 19 |  | Rahul Bhattachrya,
Santosh Biswas,
Siddhartha Mukhopadhyay:
FPGA based chip emulation system for test development and verification of analog and mixed signal circuits (abstract only).
FPGA 2010: 284 |
| 18 |  | Srikanth Pam,
Anirban Krishna Bhattacharya,
Siddhartha Mukhopadhyay:
An Efficient Method for Bottom-Up Extraction of Analog Behavioral Model Parameters.
VLSI Design 2010: 363-368 |
| 17 |  | Santosh Biswas,
Dipankar Sarkar,
Siddhartha Mukhopadhyay,
Amit Patra:
Fairness of Transitions in Diagnosability of Discrete Event Systems.
Discrete Event Dynamic Systems 20(3): 349-376 (2010) |
| 16 |  | Santosh Biswas,
Dipankar Sarkar,
Siddhartha Mukhopadhyay:
Diagnosability of delay-deadline failures in fair real time discrete event models.
Int. J. Systems Science 41(7): 763-782 (2010) |
| 15 |  | Rajdeep Mukhopadhyay,
Anvesh Komuravelli,
Pallab Dasgupta,
S. K. Panda,
Siddhartha Mukhopadhyay:
A static verification approach for architectural integration of mixed-signal integrated circuits.
Integration 43(1): 58-71 (2010) |
| 2009 |
| 14 |  | Somnath Sengupta,
Soumen De,
Anirban Krishna Bhattacharya,
Siddhartha Mukhopadhyay,
Alok Kanti Deb:
Fault detection of Air Intake Systems of SI gasoline engines using mean value and within cycle models.
CASE 2009: 361-366 |
| 13 |  | Jyotirmoy Ghosh,
Siddhartha Mukhopadhyay,
Amit Patra,
Barry Culpepper,
Tawen Mei:
A New Approach for Estimation of RDS(on) of Power Arrays: Extensions and Experimental Results.
ISCAS 2009: 3010-3013 |
| 2008 |
| 12 |  | Amitava Banerjee,
Subho Chatterjee,
Amit Patra,
Siddhartha Mukhopadhyay:
An efficient approach to model distortion in weakly nonlinear Gm - C filters.
ISCAS 2008: 1312-1315 |
| 11 |  | Jyotirmoy Ghosh,
Siddhartha Mukhopadhyay,
Amit Patra,
Barry Culpepper,
Tawen Mei:
A New Approach for Estimation of On-Resistance and Current Distribution in Power Array Layouts.
VLSI Design 2008: 331-336 |
| 10 |  | Santosh Biswas,
Siddhartha Mukhopadhyay,
Amit Patra,
Dipankar Sarkar:
Unified Technique for on-Line Testing of Digital Circuits: Delay and Stuck-at Fault Models.
Journal of Circuits, Systems, and Computers 17(6): 1069-1089 (2008) |
| 2007 |
| 9 |  | Prodip Bhowal,
Dipankar Sarkar,
Siddhartha Mukhopadhyay,
Anupam Basu:
Fault diagnosis in discrete time hybrid systems - A case study.
Inf. Sci. 177(5): 1290-1308 (2007) |
| 2006 |
| 8 |  | Santosh Biswas,
Siddhartha Mukhopadhyay,
P. Patra,
Dipankar Sarkar:
Concurrent Testing of Digital Circuits for Advanced Fault Models.
DDECS 2006: 204-209 |
| 2005 |
| 7 |  | Santosh Biswas,
P. Srikanth,
R. Jha,
Siddhartha Mukhopadhyay,
Amit Patra,
Dipankar Sarkar:
On-Line Testing of Digital Circuits for n-Detect and Bridging Fault Models.
Asian Test Symposium 2005: 88-93 |
| 6 |  | Abhijit Chatterjee,
Ali Keshavarzi,
Amit Patra,
Siddhartha Mukhopadhyay:
Test Methodologies in the Deep Submicron Era -- Analog, Mixed-Signal, and RF.
VLSI Design 2005: 12-13 |
| 5 |  | Santosh Biswas,
Siddhartha Mukhopadhyay,
Amit Patra:
A Formal Approach to On-Line Monitoring of Digital VLSI Circuits: Theory, Design and Implementation.
J. Electronic Testing 21(5): 503-537 (2005) |
| 2004 |
| 4 |  | Santosh Biswas,
Siddhartha Mukhopadhyay,
Amit Patra:
A BIST Approach to On-Line Monitoring of Digital VLSI Circuits: A CAD Tool.
Asian Test Symposium 2004: 184-189 |
| 3 |  | Santosh Biswas,
Siddhartha Mukhopadhyay,
Amit Patra:
Optimization of the Theory of FDD of DES for Alleviation of the State Explosion Problem and Development of CAD Tools for On-line Testing of Digital VLSI Circuits.
IOLTS 2004: 184- |
| 2 |  | Santosh Biswas,
Siddhartha Mukhopadhyay,
Amit Patra:
A discrete event systems approach to online testing of digital VLSI circuits.
SMC (2) 2004: 1699-1704 |
| 1995 |
| 1 |  | Supratik Bose,
Siddhartha Mukhopadhyay:
An extended finitely recursive process model for discrete event systems.
IEEE Transactions on Systems, Man, and Cybernetics 25(12): 1616-1627 (1995) |