Georg Mueller

	2008
2		Zaid Al-Ars, Said Hamdioui, A. J. van de Goor, Georg Mueller: Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs. ITC 2008: 1-10
	2005
1		Zaid Al-Ars, Said Hamdioui, Georg Mueller, A. J. van de Goor: Framework for Fault Analysis and Test Generation in DRAMs. DATE 2005: 1020-1021

Coauthor Index

1	Zaid Al-Ars	[1] [2]
2	A. J. van de Goor	[1] [2]
3	Said Hamdioui	[1] [2]

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