Grzegorz Mrugalski

	2011
37		Grzegorz Mrugalski, Artur Pogiel, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Pawel Urbanek: Fault Diagnosis in Memory BIST Environment with Non-march Tests. Asian Test Symposium 2011: 419-424
36		Michal Filipek, Yoshiaki Fukui, Hiroyuki Iwata, Grzegorz Mrugalski, Janusz Rajski, Masahiro Takakura, Jerzy Tyszer: Low Power Decompressor and PRPG with Constant Value Broadcast. Asian Test Symposium 2011: 84-89
35		Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer: Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. European Test Symposium 2011: 1-6
34		Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: Reduced ATE Interface for High Test Data Compression. European Test Symposium 2011: 99-104
33		Jakub Janicki, Jerzy Tyszer, Avijit Dutta, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski: EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism. ITC 2011: 1-9
32		Nilanjan Mukherjee, Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer: Ring Generator: An Ultimate Linear Feedback Shift Register. IEEE Computer 44(6): 64-71 (2011)
31		Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer: Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression. IEEE Trans. on CAD of Integrated Circuits and Systems 30(8): 1225-1238 (2011)
30		Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer: Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. J. Electronic Testing 27(5): 599-609 (2011)
	2010
29		Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer: Diagnosis of failing scan cells through orthogonal response compaction. European Test Symposium 2010: 221-226
28		Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jakub Janicki, Jerzy Tyszer: Dynamic channel allocation for higher EDT compression in SoC designs. ITC 2010: 265-274
27		Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, P. Szczerbicki, Jerzy Tyszer: Low power compression of incompatible test cubes. ITC 2010: 704-713
26		Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: On Compaction Utilizing Inter and Intra-Correlation of Unknown States. IEEE Trans. on CAD of Integrated Circuits and Systems 29(1): 117-126 (2010)
	2009
25		Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer: Compression based on deterministic vector clustering of incompatible test cubes. ITC 2009: 1-10
24		Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer: Highly X-Tolerant Selective Compaction of Test Responses. VTS 2009: 245-250
23		Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Low-Power Scan Operation in Test Compression Environment. IEEE Trans. on CAD of Integrated Circuits and Systems 28(11): 1742-1755 (2009)
	2008
22		Dariusz Czysz, Mark Kassab, Xijiang Lin, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Low Power Scan Shift and Capture in the EDT Environment. ITC 2008: 1-10
21		Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab: X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector. IEEE Trans. on CAD of Integrated Circuits and Systems 27(1): 147-159 (2008)
20		Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Low-Power Test Data Application in EDT Environment Through Decompressor Freeze. IEEE Trans. on CAD of Integrated Circuits and Systems 27(7): 1278-1290 (2008)
	2007
19		Grzegorz Mrugalski, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer: New Test Data Decompressor for Low Power Applications. DAC 2007: 539-544
18		Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Low Power Embedded Deterministic Test. VTS 2007: 75-83
17		Jerzy Tyszer, Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Mark Kassab, Wu-Tung Cheng, Manish Sharma, Liyang Lai: X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis. IEEE Design & Test of Computers 24(5): 476-485 (2007)
16		Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: Fault Diagnosis With Convolutional Compactors. IEEE Trans. on CAD of Integrated Circuits and Systems 26(8): 1478-1494 (2007)
15		Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer: Isolation of Failing Scan Cells through Convolutional Test Response Compaction. J. Electronic Testing 23(1): 35-45 (2007)
	2006
14		Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Test response compactor with programmable selector. DAC 2006: 1089-1094
13		Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Nilanjan Mukherjee, Mark Kassab: X-Press Compactor for 1000x Reduction of Test Data. ITC 2006: 1-10
12		Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: High Performance Dense Ring Generators. IEEE Trans. Computers 55(1): 83-87 (2006)
	2005
11		Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: Diagnosis with convolutional compactors in presence of unknown states. ITC 2005: 10
	2004
10		Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski: Fault Diagnosis in Designs with Convolutional Compactors. ITC 2004: 498-507
9		Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: Planar High Performance Ring Generators. VTS 2004: 193-198
8		Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Ring generators - new devices for embedded test applications. IEEE Trans. on CAD of Integrated Circuits and Systems 23(9): 1306-1320 (2004)
	2003
7		Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: High Speed Ring Generators and Compactors of Test Data. VTS 2003: 57-62
6		Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski: 2D Test Sequence Generators. IEEE Design & Test of Computers 20(1): 51-59 (2003)
	2002
5		Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian: Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC 2002: 301-310
	2000
4		Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski: Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators. VTS 2000: 377-388
3		Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Cellular automata-based test pattern generators with phase shifters. IEEE Trans. on CAD of Integrated Circuits and Systems 19(8): 878-893 (2000)
	1999
2		Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski: Synthesis of pattern generators based on cellular automata with phase shifters. ITC 1999: 368-377
1		Janusz Rajski, Grzegorz Mrugalski, Jerzy Tyszer: Comparative Study of CA-based PRPGs and LFSRs with Phase Shifters. VTS 1999: 236-245

Coauthor Index

1	Brady Benware	[29] [30] [35]
2	Wu-Tung Cheng	[13] [17] [21]
3	Dariusz Czysz	[18] [19] [20] [22] [23] [24] [25] [26] [27] [31] [34]
4	Avijit Dutta	[33]
5	Geir Eide	[5]
6	Michal Filipek	[36]
7	Yoshiaki Fukui	[36]
8	Andre Hertwig	[5]
9	Hiroyuki Iwata	[36]
10	Jakub Janicki	[28] [33]
11	Mark Kassab	[5] [13] [17] [21] [22] [23] [28] [33]
12	Liyang Lai	[17]
13	Xijiang Lin	[22] [23]
14	Nilanjan Mukherjee	[5] [9] [12] [13] [17] [21] [24] [25] [26] [27] [28] [31] [32] [33] [34] [37]
15	Artur Pogiel	[10] [11] [15] [16] [29] [30] [32] [35] [37]
16	Jun Qian	[5]
17	Janusz Rajski	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [37]
18	Manish Sharma	[17]
19	Jedrzej Solecki	[29] [30] [35]
20	P. Szczerbicki	[27] [31]
21	Masahiro Takakura	[36]
22	Nagesh Tamarapalli	[5]
23	Rob Thompson	[5]
24	Kun-Han Tsai	[5]
25	Jerzy Tyszer	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [37]
26	Pawel Urbanek	[37]
27	Chen Wang	[10] [15]

Last update Sat Feb 11 22:55:45 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page