M. Mouis

	2001
1		L. Militaru, A. Souifi, M. Mouis, A. Chantre, G. Brémond: Investigation of deep traps in silicon-germanium epitaxial base bipolar transistors with a single polysilicon quasi self-aligned architecture. Microelectronics Reliability 41(2): 253-263 (2001)

Coauthor Index

1	G. Brémond	[1]
2	A. Chantre	[1]
3	L. Militaru	[1]
4	A. Souifi (Abdelkader Souifi)	[1]

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