 | 2005 |
|---|
| 6 |       | Cezary Sydlo,
Jochen Sigmund,
Bastian Mottet,
Hans L. Hartnagel:
Reliability investigations on LTG-GaAs photomixers for THz generation based on optical heterodyning.
Microelectronics Reliability 45(9-11): 1600-1604 (2005) |
| 2004 |
|---|
| 5 | | Stephan Biber,
Oleg Cojocari,
Günther Rehm,
Bastian Mottet,
Manuel Rodríguez-Gironés,
Lorenz-Peter Schmidt,
Hans L. Hartnagel:
A novel system for systematic microwave noise and DC characterization of terahertz Schottky diodes.
IEEE T. Instrumentation and Measurement 53(2): 581-587 (2004) |
| 2003 |
|---|
| 4 | | Cezary Sydlo,
K. Mutamba,
L. Divac Krnic,
Bastian Mottet,
Hans L. Hartnagel:
Reliability studies on integrated GaAs power-sensor structures using pulsed electrical stress.
Microelectronics Reliability 43(9-11): 1929-1933 (2003) |
| 2002 |
|---|
| 3 | | Cezary Sydlo,
M. Saglam,
Bastian Mottet,
Manuel Rodríguez-Gironés,
Hans L. Hartnagel:
Reliability investigations on HBV using pulsed electrical stress.
Microelectronics Reliability 42(9-11): 1563-1568 (2002) |
| 2 | | V. Ichizli,
Manuel Rodríguez-Gironés,
L. Marchand,
C. Garden,
Oleg Cojocari,
Bastian Mottet,
Hans L. Hartnagel:
Process Control and Failure Analysis Implementation for THz Schottky-based components.
Microelectronics Reliability 42(9-11): 1593-1596 (2002) |
| 2001 |
|---|
| 1 |  | Cezary Sydlo,
Bastian Mottet,
Husin Ganis,
Hans L. Hartnagel,
Viktor Krozer,
S. L. Delage,
Simone Cassette,
Eric Chartier,
D. Floriot,
Steven Bland:
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.
Microelectronics Reliability 41(9-10): 1567-1571 (2001) |
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