Shohei Morishima

	2007
3		Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo: Estimation of delay test quality and its application to test generation. ICCAD 2007: 413-417
	2006
2		Seiji Kajihara, Shohei Morishima, Akane Takuma, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato: A Framework of High-quality Transition Fault ATPG for Scan Circuits. ITC 2006: 1-6
	2005
1		Xiaoqing Wen, Yoshiyuki Yamashita, Shohei Morishima, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita: Low-capture-power test generation for scan-based at-speed testing. ITC 2005: 10

Coauthor Index

1	Takashi Aikyo	[3]
2	Masayasu Fukunaga	[3]
3	Shuji Hamada	[2]
4	Kazumi Hatayama	[3]
5	Seiji Kajihara	[1] [2] [3]
6	Kozo Kinoshita	[1]
7	Toshiyuki Maeda	[2]
8	Kewal K. Saluja	[1]
9	Yasuo Sato	[2]
10	Akane Takuma	[2]
11	Laung-Terng Wang	[1]
12	Xiaoqing Wen	[1] [2] [3]
13	Masahiro Yamamoto	[3]
14	Yoshiyuki Yamashita	[1]

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