 | 2008 |
| 3 |  | A. Cuadras,
B. Garrido,
J. R. Morante,
L. Fonseca:
Leakage currents and dielectric breakdown of Si1-x-yGexCy thermal oxides.
Microelectronics Reliability 48(10): 1635-1640 (2008) |
| 2005 |
| 2 |  | Josep Carreras,
B. Garrido,
J. R. Morante:
Improved charge injection in Si nanocrystal non-volatile memories.
Microelectronics Reliability 45(5-6): 899-902 (2005) |
| 2003 |
| 1 |  | A. Cazarré,
F. Lépinois,
A. Marty,
S. Pinel,
J. Tasselli,
J. P. Bailbé,
J. R. Morante,
F. Murray:
Electrical qualification of new ultrathin integration techniques.
Microelectronics Reliability 43(1): 111-115 (2003) |