Joo Tae Moon

	2005
3		Jin-Wook Lee, Gyoung Ho Buh, Guk-Hyon Yon, Tai-su Park, Yu Gyun Shin, U-In Chung, Joo Tae Moon: Elimination of surface state induced edge transistors in high voltage NMOSFETs for flash memory devices. Microelectronics Reliability 45(9-11): 1394-1397 (2005)
	2003
2		Young Pil Kim, U-In Chung, Joo Tae Moon, Sang U. Kim: Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure. Microelectronics Reliability 43(9-11): 1461-1464 (2003)
	2001
1		Young Pil Kim, Beom Jun Jin, Young Wook Park, Joo Tae Moon, Sang U. Kim: Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs. Microelectronics Reliability 41(9-10): 1301-1305 (2001)

Coauthor Index

1	Gyoung Ho Buh	[3]
2	U-In Chung	[2] [3]
3	Beom Jun Jin	[1]
4	Sang U. Kim	[1] [2]
5	Young Pil Kim	[1] [2]
6	Jin-Wook Lee	[3]
7	Tai-su Park	[3]
8	Young Wook Park	[1]
9	Yu Gyun Shin	[3]
10	Guk-Hyon Yon	[3]

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