T. Mollenhauer

	2009
2		R. Peibst, T. Dürkop, E. Bugiel, N. Koo, T. Mollenhauer, M. C. Lemme, H. Kurz, K. R. Hofmann: PECVD grown Ge nanocrystals embedded in SiO2: From disordered to templated self-organization. Microelectronics Journal 40(4-5): 759-761 (2009)
	2005
1		M. C. Lemme, J. K. Efavi, H. D. B. Gottlob, T. Mollenhauer, T. Wahlbrink, H. Kurz: Comparison of metal gate electrodes on MOCVD HfO2. Microelectronics Reliability 45(5-6): 953-956 (2005)

Coauthor Index

1	E. Bugiel	[2]
2	T. Dürkop	[2]
3	J. K. Efavi	[1]
4	H. D. B. Gottlob	[1]
5	K. R. Hofmann	[2]
6	N. Koo	[2]
7	H. Kurz	[1] [2]
8	M. C. Lemme	[1] [2]
9	R. Peibst	[2]
10	T. Wahlbrink	[1]

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