 | 2011 |
| 11 |  | Lancelot Garcia-Leyva,
Antonio Calomarde,
Francesc Moll,
Antonio Rubio:
A new probabilistic design methodology of nanoscale digital circuits.
CONIELECOMP 2011: 190-193 |
| 10 |  | Marc Pons,
Francesc Moll,
Antonio Rubio,
Jaume Abella,
Xavier Vera,
Antonio González:
Design of complex circuits using the Via-Configurable transistor array regular layout fabric.
SoCC 2011: 166-169 |
| 9 |  | Joan Mauricio,
Francesc Moll,
Josep Altet:
Monitor strategies for variability reduction considering correlation between power and timing variability.
SoCC 2011: 225-230 |
| 8 |  | Lancelot Garcia-Leyva,
Dennis Andrade,
Sergio Gómez,
Antonio Calomarde,
Francesc Moll,
Antonio Rubio:
New redundant logic design concept for high noise and low voltage scenarios.
Microelectronics Journal 42(12): 1359-1369 (2011) |
| 2010 |
| 7 |  | Marc Pons,
Francesc Moll,
Antonio Rubio,
Jaume Abella,
Xavier Vera,
Antonio González:
VCTA: A Via-Configurable Transistor Array regular fabric.
VLSI-SoC 2010: 335-340 |
| 6 |  | Sergio Gómez,
Francesc Moll:
Lithography Aware Regular Cell Design Based on a Predictive Technology Model.
J. Low Power Electronics 6(4): 588-600 (2010) |
| 2009 |
| 5 |  | Dennis Andrade,
Ferran Martorell,
Arindam Calomarde,
Francesc Moll,
Antonio Rubio:
A new compensation mechanism for environmental parameter fluctuations in CMOS digital ICs.
Microelectronics Journal 40(6): 952-957 (2009) |
| 2008 |
| 4 |  | Francesc Moll,
Joan Figueras,
Antonio Rubio:
Data Dependence of Delay Distribution for a Planar Bus.
PATMOS 2008: 409-418 |
| 2003 |
| 3 |  | Eugeni Isern,
Miquel Roca,
Francesc Moll:
Analysis of the Contribution of Interconnect Effects in the Energy Dissipation of VLSI Circuits.
PATMOS 2003: 481-490 |
| 2 |  | Francesc Moll,
Miquel Roca,
Eugeni Isern:
Analysis of dissipation energy of switching digital CMOS gates with coupled outputs.
Microelectronics Journal 34(9): 833-842 (2003) |
| 2002 |
| 1 |  | Xavier Aragonès,
José Luis González,
Francesc Moll,
Antonio Rubio:
Noise Generation and Coupling Mechanisms in Deep-Submicron ICs.
IEEE Design & Test of Computers 19(5): 27-35 (2002) |