C. Moglestue

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2001

2 W. T. Anderson, J. A. Roussos, J. A. Mittereder, D. E. Ioannou, C. Moglestue: Pseudomorphic high electron mobility transistor monolithic microwave integrated circuits reliability study. Microelectronics Reliability 41(8): 1109-1113 (2001)

1985

1 C. Moglestue: A Monte Carlo Particle Study of the Intrinsic Noise Figure in GaAs MESFET's. IEEE Trans. on CAD of Integrated Circuits and Systems 4(4): 536-540 (1985)

	2001
2		W. T. Anderson, J. A. Roussos, J. A. Mittereder, D. E. Ioannou, C. Moglestue: Pseudomorphic high electron mobility transistor monolithic microwave integrated circuits reliability study. Microelectronics Reliability 41(8): 1109-1113 (2001)
	1985
1		C. Moglestue: A Monte Carlo Particle Study of the Intrinsic Noise Figure in GaAs MESFET's. IEEE Trans. on CAD of Integrated Circuits and Systems 4(4): 536-540 (1985)

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