Elham K. Moghaddam

	2011
6		Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Jakub Janicki: Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating. Asian Test Symposium 2011: 267-272
5		Xijiang Lin, Elham K. Moghaddam, Nilanjan Mukherjee, Benoit Nadeau-Dostie, Janusz Rajski, Jerzy Tyszer: Power Aware Embedded Test. Asian Test Symposium 2011: 511-516
4		Janusz Rajski, Elham K. Moghaddam, Sudhakar M. Reddy: Low power compression utilizing clock-gating. ITC 2011: 1-8
	2010
3		Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Xijiang Lin, Nilanjan Mukherjee, Mark Kassab: Low capture power at-speed test in EDT environment. ITC 2010: 714-723
2		Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Mark Kassab: At-speed scan test with low switching activity. VTS 2010: 177-182
	2007
1		Elham K. Moghaddam, Shaahin Hessabi: An On-Line BIST Technique for Stuck-Open Fault Detection in CMOS Circuits. DSD 2007: 619-625

Coauthor Index

1	Shaahin Hessabi	[1]
2	Jakub Janicki	[6]
3	Mark Kassab	[2] [3]
4	Xijiang Lin	[3] [5]
5	Nilanjan Mukherjee	[3] [5]
6	Benoit Nadeau-Dostie	[5]
7	Janusz Rajski	[2] [3] [4] [5] [6]
8	Sudhakar M. Reddy	[2] [3] [4] [6]
9	Jerzy Tyszer	[5]

Colors in the list of coauthors

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