Kazuhiro Mochizuki

	2006
1		Kazuhiro Mochizuki, Ken-ichi Tanaka, Takashi Shiota, Takafumi Taniguchi, Hiroyuki Uchiyama: Effects of Rapid Thermal Annealing on Bias-Stress-Induced Base Leakage in InGaP/GaAs Collector-Up Heterojunction Bipolar Transistors Fabricated with B Ion Implantation. IEICE Transactions 89-C(7): 943-948 (2006)

Coauthor Index

1	Takashi Shiota	[1]
2	Ken-ichi Tanaka	[1]
3	Takafumi Taniguchi	[1]
4	Hiroyuki Uchiyama	[1]

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