 | 2011 |
|---|
| 9 |       | Kiyoshi Nikawa,
Masatsugu Yamashita,
Toru Matsumoto,
Katsuyoshi Miura,
Yoshihiro Midoh,
Koji Nakamae:
The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization.
Microelectronics Reliability 51(9-11): 1624-1631 (2011) |
| 2009 |
|---|
| 8 | | Kiyoshi Nikawa,
Shoji Inoue,
Tatsuoki Nagaishi,
Toru Matsumoto,
Katsuyoshi Miura,
Koji Nakamae:
New Approach of Laser-SQUID Microscopy to LSI Failure Analysis.
IEICE Transactions 92-C(3): 327-333 (2009) |
| 7 | | Masatsugu Yamashita,
Chiko Otani,
Sunmi Kim,
Hironaru Murakami,
Masayoshi Tonouchi,
Toru Matsumoto,
Yoshihiro Midoh,
Katsuyoshi Miura,
Koji Nakamae,
Kiyoshi Nikawa:
Laser THz emission microscope as a novel tool for LSI failure analysis.
Microelectronics Reliability 49(9-11): 1116-1126 (2009) |
| 2003 |
|---|
| 6 | | Katsuyoshi Miura,
Tomoyuki Kobatake,
Koji Nakamae,
Hiromu Fujioka:
A low energy FIB processing, repair, and test system.
Microelectronics Reliability 43(9-11): 1627-1631 (2003) |
| 2002 |
|---|
| 5 | | Katsuyoshi Miura,
Koji Nakamae,
Hiromu Fujioka:
CAD navigation system, for backside waveform probing of CMOS devices.
Microelectronics Reliability 42(9-11): 1679-1684 (2002) |
| 2001 |
|---|
| 4 |  | Katsuyoshi Miura,
Koji Nakamae,
Hiromu Fujioka:
Development of an EB/FIB Integrated Test System.
Microelectronics Reliability 41(9-10): 1489-1494 (2001) |
| 1999 |
|---|
| 3 | | Katsuyoshi Miura,
Koji Nakamae,
Hiromu Fujioka:
Intelligent EB Test System for Automatic VLSI Fault Tracing.
Asian Test Symposium 1999: 335-341 |
| 1997 |
|---|
| 2 | | Katsuyoshi Miura,
Kohei Nakata,
Koji Nakamae,
Hiromu Fujioka:
Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout Data.
Asian Test Symposium 1997: 162-167 |
| 1 | | Katsuyoshi Miura,
Koji Nakamae,
Hiromu Fujioka:
Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test System.
J. Electronic Testing 10(3): 255-269 (1997) |
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