Steven W. Mittl

	1999
1		W. W. (Bill) Abadeer, Asmik Bagramian, David W. Conkle, Charles W. Griffin, Eric Langlois, Brian F. Lloyd, Raymond P. Mallette, James E. Massucco, Jonathan M. McKenna, Steven W. Mittl, Philip H. Noel: Key measurements of ultrathin gate dielectric reliability and in-line monitoring. IBM Journal of Research and Development 43(3): 407-416 (1999)

Coauthor Index

1	W. W. (Bill) Abadeer	[1]
2	Asmik Bagramian	[1]
3	David W. Conkle	[1]
4	Charles W. Griffin	[1]
5	Eric Langlois	[1]
6	Brian F. Lloyd	[1]
7	Raymond P. Mallette	[1]
8	James E. Massucco	[1]
9	Jonathan M. McKenna	[1]
10	Philip H. Noel	[1]

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