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- CSB - MetaPress - Google - Bing - Yahoo
 | 2009 | |
|---|---|---|
| 2 |      | Yasuhiro Mitsui, Takeshi Sunaoshi, Jon C. Lee: A study of electrical characteristic changes in MOSFET by electron beam irradiation. Microelectronics Reliability 49(9-11): 1182-1187 (2009) |
| 2001 | ||
| 1 | | Yasuhiro Mitsui, Fumiko Yano, Hiroshi Kakibayashi, Hiroyasu Shichi, Takashi Aoyama: Developments of new concept analytical instruments for failure analyses of sub-100 nm devices. Microelectronics Reliability 41(8): 1171-1183 (2001) |
| 1 | Takashi Aoyama | [1] |
| 2 | Hiroshi Kakibayashi | [1] |
| 3 | Jon C. Lee | [2] |
| 4 | Hiroyasu Shichi | [1] |
| 5 | Takeshi Sunaoshi | [2] |
| 6 | Fumiko Yano | [1] |
Colors in the list of coauthors
Last update Sun Jun 3 16:06:10 2012 CET by the DBLP Team —
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