E. Misra

	2006
2		E. Misra, N. D. Theodore, J. W. Mayer, T. L. Alford: Failure mechanisms of pure silver, pure aluminum and silver-aluminum alloy under high current stress. Microelectronics Reliability 46(12): 2096-2103 (2006)
	2005
1		E. Misra, Md M. Islam, Mahbub Hasan, H. C. Kim, T. L. Alford: Percolative approach for failure time prediction of thin film interconnects under high current stress. Microelectronics Reliability 45(2): 391-395 (2005)

Coauthor Index

1	T. L. Alford	[1] [2]
2	Mahbub Hasan	[1]
3	Md M. Islam	[1]
4	H. C. Kim	[1]
5	J. W. Mayer	[2]
6	N. D. Theodore	[2]

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