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Dany Minier Coauthor index pubzone.org

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DBLP keys2010
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDavid C. Keezer, Carl Gray, Dany Minier, Patrice Ducharme: Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic. J. Electronic Testing 26(1): 87-96 (2010)
2009
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDavid C. Keezer, Carl Gray, A. M. Majid, Dany Minier, Patrice Ducharme: A development platform and electronic modules for automated test up to 20 Gbps. ITC 2009: 1-11
2008
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDavid C. Keezer, Dany Minier, Patrice Ducharme: Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications. DATE 2008: 1486-1491
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDavid C. Keezer, Dany Minier, Patrice Ducharme, A. M. Majid: An Electronic Module for 12.8 Gbps Multiplexing and Loopback Test. ITC 2008: 1-9
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDavid C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop: MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing. VLSI Design 2008: (2008)
2007
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDavid C. Keezer, Dany Minier, Patrice Ducharme: Method for reducing jitter in multi-gigahertz ATE. DATE 2007: 701-706
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDavid C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop: Multi-GHz loopback testing using MEMs switches and SiGe logic. ITC 2007: 1-10
2006
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDavid C. Keezer, Dany Minier, Patrice Ducharme: Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses. IEEE Design & Test of Computers 23(1): 46-57 (2006)
2004
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDavid C. Keezer, Dany Minier, F. Binette: Modular Extension of ATE to 5 Gbps. ITC 2004: 748-757
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDavid C. Keezer, Dany Minier, Marie-Christine Caron: Multiplexing ATE Channels for Production Testing at 2.5 Gbps. IEEE Design & Test of Computers 21(4): 288-301 (2004)
2003
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDavid C. Keezer, Dany Minier, Marie-Christine Caron: A Production-Oriented Multiplexing System for Testing above 2.5 Gbps. ITC 2003: 191-200

Coauthor Index

1F. Binette [3]
2Marie-Christine Caron [1] [2]
3Patrice Ducharme [4] [5] [6] [7] [8] [9] [10] [11]
4Greg Flynn [5] [7]
5Carl Gray [10] [11]
6David C. Keezer [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11]
7A. M. Majid [8] [10]
8John McKillop [5] [7]
9Doris Viens [5] [7]

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