P. Min

	2006
1		P. Min, H. Yi, J. Song, S. Baeg, S. Park: Efficient Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2605-2608 (2006)

Coauthor Index

1	S. Baeg	[1]
2	S. Park	[1]
3	J. Song	[1]
4	H. Yi	[1]

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