L. Militaru

	2011
4		W. Hourani, B. Gautier, L. Militaru, D. Albertini, A. Descamps-Mandine, R. Arinero: Influence of the surrounding ambient on the reliability of the electrical characterization of thin oxide layers using an atomic force microscope. Microelectronics Reliability 51(12): 2097-2101 (2011)
	2007
3		N. Sghaier, L. Militaru, M. Trabelsi, N. Yacoubi, A. Souifi: Analysis of slow traps centres in submicron MOSFETs by random telegraph signal technique. Microelectronics Journal 38(4-5): 610-614 (2007)
2		T. Nguyen, C. Busseret, L. Militaru, A. Poncet, D. Aimé, Nicolas Baboux, C. Plossu: Parameters extraction of hafnium based gate oxide capacitors. Microelectronics Reliability 47(4-5): 729-732 (2007)
	2001
1		L. Militaru, A. Souifi, M. Mouis, A. Chantre, G. Brémond: Investigation of deep traps in silicon-germanium epitaxial base bipolar transistors with a single polysilicon quasi self-aligned architecture. Microelectronics Reliability 41(2): 253-263 (2001)

Coauthor Index

1	D. Aimé	[2]
2	D. Albertini	[4]
3	R. Arinero	[4]
4	Nicolas Baboux	[2]
5	G. Brémond	[1]
6	C. Busseret	[2]
7	A. Chantre	[1]
8	A. Descamps-Mandine	[4]
9	B. Gautier	[4]
10	W. Hourani	[4]
11	M. Mouis	[1]
12	T. Nguyen	[2]
13	C. Plossu	[2]
14	A. Poncet	[2]
15	N. Sghaier	[3]
16	A. Souifi (Abdelkader Souifi)	[1] [3]
17	M. Trabelsi	[3]
18	N. Yacoubi	[3]

Colors in the list of coauthors

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