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| 1997 | ||
|---|---|---|
| 1 | Chieh-Yuan Chao, Hung-Jen Lin, L. Miler: Optimal testing of VLSI analog circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 16(1): 58-77 (1997) | |
| 1 | Chieh-Yuan Chao | [1] |
| 2 | Hung-Jen Lin | [1] |
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