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Hiroyuki Michinishi Coauthor index pubzone.org

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9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: Detection of CMOS Open Node Defects by Frequency Analysis. IEICE Transactions 90-D(3): 685-687 (2007)
2004
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. IEICE Transactions 87-D(3): 551-556 (2004)
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMitsuyasu Kagiyama, Hiroyuki Michinishi, Hiroto Kagotani, Takuji Okamoto, Yasuo Ogasawara, Fumihiko Kajiya: Model analysis of coronary hemodynamics incorporating autoregulation. Systems and Computers in Japan 35(14): 21-31 (2004)
2003
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. Asian Test Symposium 2003: 406-411
2002
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. Asian Test Symposium 2002: 417-422
1997
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara: Testing for the programming circuit of LUT-based FPGAs. Asian Test Symposium 1997: 242-247
1996
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara: A Test Methodology for Interconnect Structures of LUT-based FPGAs. Asian Test Symposium 1996: 68-74
1995
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLTomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto: Universal test complexity of field-programmable gate arrays. Asian Test Symposium 1995: 259-265
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLTokumi Yokohira, Toshimi Shimizu, Hiroyuki Michinishi, Yuji Sugiyama, Takuji Okamoto: The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs. IEICE Transactions 78-D(7): 874-881 (1995)

Coauthor Index

1Hideo Fujiwara [2] [3] [4]
2Tsutomu Hondo [5] [6] [8] [9]
3Tomoo Inoue [2] [3] [4]
4Mitsuyasu Kagiyama [7]
5Hiroto Kagotani [7]
6Fumihiko Kajiya [7]
7Toshifumi Kobayashi [5] [6] [8] [9]
8Yasuo Ogasawara [7]
9Takuji Okamoto [1] [2] [3] [4] [5] [6] [7] [8] [9]
10Toshimi Shimizu [1]
11Yuji Sugiyama [1]
12Tokumi Yokohira [1] [2] [3] [4] [5] [6] [8] [9]

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