 | 2011 |
| 11 |  | Linus Michaeli,
Marek Godla,
Ján Saliga:
Remote access cost effective measurement stand for teaching basic electronic circuits.
IDAACS (1) 2011: 188-191 |
| 2010 |
| 10 |  | Linus Michaeli,
Sergio Rapuano:
Preface to the special issue on XV IMEKO TC-4 Symposium and XII International Workshop on ADC Modelling and Testing.
Computer Standards & Interfaces 32(3): 71-72 (2010) |
| 2009 |
| 9 |  | Pasquale Arpaia,
Linus Michaeli,
Sergio Rapuano:
Model-Based Compensation of SAR Nonlinearity.
IEEE T. Instrumentation and Measurement 58(3): 541-550 (2009) |
| 8 |  | Lukas Fujcik,
Linus Michaeli,
Jiri Haze,
Radimir Vrba:
Sensor Signal Digitization Utilizing a Band-Pass Sigma-Delta Modulator.
IEICE Transactions 92-C(6): 860-863 (2009) |
| 2008 |
| 7 |  | Lukas Fujcik,
Radimir Vrba,
Linus Michaeli,
Jiri Haze:
Digital Synchronization Utilizing Harmonic Signal Generator for Capacitive Pressure Sensor Measurement.
ICONS 2008: 47-50 |
| 6 |  | Luca De Vito,
Linus Michaeli,
Sergio Rapuano:
An Improved ADC-Error-Correction Scheme Based on a Bayesian Approach.
IEEE T. Instrumentation and Measurement 57(1): 128-133 (2008) |
| 2007 |
| 5 |  | Lukas Fujcik,
Jiri Haze,
Radimir Vrba,
Jiri Forejtek,
Pavel Zavoral,
Roman Prokop,
Linus Michaeli:
Modeling and Design of a Novel Integrated Band-Pass Sigma-Delta Modulator.
PWC 2007: 637-648 |
| 2005 |
| 4 |  | António Manuel da Cruz Serra,
Manuel Fonseca da Silva,
Pedro M. Ramos,
Raul Carneiro Martins,
Linus Michaeli,
Ján Saliga:
Combined spectral and histogram analysis for fast ADC testing.
IEEE T. Instrumentation and Measurement 54(4): 1617-1623 (2005) |
| 2003 |
| 3 |  | Ján Saliga,
Linus Michaeli:
Software for metrological characterisation of PC sound cards.
Computer Standards & Interfaces 25(1): 45-55 (2003) |
| 2 |  | Roland Holcer,
Linus Michaeli,
Ján Saliga:
DNL ADC testing by the exponential shaped voltage.
IEEE T. Instrumentation and Measurement 52(3): 946-949 (2003) |
| 2002 |
| 1 |  | Pasquale Arpaia,
Pasquale Daponte,
Domenico Grimaldi,
Linus Michaeli:
ANN-based error reduction for experimentally modeled sensors.
IEEE T. Instrumentation and Measurement 51(1): 23-30 (2002) |