 | 2011 |
| 14 |  | Geert Eneman,
J. Cho,
V. Moroz,
Dragomir Milojevic,
M. Choi,
Kristin De Meyer,
Abdelkarim Mercha,
Eric Beyne,
Thomas Hoffmann,
Geert Van der Plas:
An analytical compact model for estimation of stress in multiple Through-Silicon Via configurations.
DATE 2011: 505-506 |
| 13 |  | Geert Van der Plas,
Paresh Limaye,
Igor Loi,
Abdelkarim Mercha,
Herman Oprins,
Cristina Torregiani,
Steven Thijs,
Dimitri Linten,
Michele Stucchi,
Guruprasad Katti,
Dimitrios Velenis,
Vladimir Cherman,
Bart Vandevelde,
Veerle Simons,
Ingrid De Wolf,
Riet Labie,
Dan Perry,
Stephane Bronckers,
Nikolaos Minas,
Miro Cupac,
Wouter Ruythooren,
Jan Van Olmen,
Alain Phommahaxay,
Muriel de Potter de ten Broeck,
Ann Opdebeeck,
Michal Rakowski,
Bart De Wachter,
Morin Dehan,
Marc Nelis,
Rahul Agarwal,
Antonio Pullini,
Federico Angiolini,
Luca Benini,
Wim Dehaene,
Youssef Travaly,
Eric Beyne,
Paul Marchal:
Design Issues and Considerations for Low-Cost 3-D TSV IC Technology.
J. Solid-State Circuits 46(1): 293-307 (2011) |
| 2010 |
| 12 |  | Geert Van der Plas,
Steven Thijs,
Dimitri Linten,
Guruprasad Katti,
Paresh Limaye,
Abdelkarim Mercha,
Michele Stucchi,
Herman Oprins,
Bart Vandevelde,
Nikolaos Minas,
Miro Cupac,
Morin Dehan,
Marc Nelis,
Rahul Agarwal,
Wim Dehaene,
Youssef Travaly,
Eric Beyne,
Paul Marchal:
Verifying electrical/thermal/thermo-mechanical behavior of a 3D stack - Challenges and solutions.
CICC 2010: 1-4 |
| 11 |  | Nikolaos Minas,
Ingrid De Wolf,
Erik Jan Marinissen,
Michele Stucchi,
Herman Oprins,
Abdelkarim Mercha,
Geert Van der Plas,
Dimitrios Velenis,
Pol Marchal:
3D integration: Circuit design, test, and reliability challenges.
IOLTS 2010: 217 |
| 10 |  | Wen-Chieh Wang,
Zue-Der Huang,
Geert Carchon,
Abdelkarim Mercha,
Stefaan Decoutere,
Walter De Raedt,
Chung-Yu Wu:
45-nm Planar bulk-CMOS 23-GHz LNAs with high-Q above-IC inductors.
ISCAS 2010: 741-744 |
| 9 |  | Geert Van der Plas,
Paresh Limaye,
Abdelkarim Mercha,
Herman Oprins,
Cristina Torregiani,
Steven Thijs,
Dimitri Linten,
Michele Stucchi,
Guruprasad Katti,
Dimitrios Velenis,
Domae Shinichi,
Vladimir Cherman,
Bart Vandevelde,
Veerle Simons,
Ingrid De Wolf,
Riet Labie,
Dan Perry,
Stephane Bronckers,
Nikolaos Minas,
Miro Cupac,
Wouter Ruythooren,
Jan Van Olmen,
Alain Phommahaxay,
Muriel de Potter de ten Broeck,
Ann Opdebeeck,
Michal Rakowski,
Bart De Wachter,
Morin Dehan,
Marc Nelis,
Rahul Agarwal,
Wim Dehaene,
Youssef Travaly,
Pol Marchal,
Eric Beyne:
Design issues and considerations for low-cost 3D TSV IC technology.
ISSCC 2010: 148-149 |
| 8 |  | Vaidyanathan Subramanian,
Abdelkarim Mercha,
Bertrand Parvais,
Morin Dehan,
Guido Groeseneken,
Willy M. C. Sansen,
Stefaan Decoutere:
Identifying the Bottlenecks to the RF Performance of FinFETs.
VLSI Design 2010: 111-116 |
| 2009 |
| 7 |  | Jan Van Olmen,
Jan Coenen,
Wim Dehaene,
Kristin De Meyer,
Cedric Huyghebaert,
Anne Jourdain,
Guruprasad Katti,
Abdelkarim Mercha,
Michal Rakowski,
Michele Stucchi,
Youssef Travaly,
Eric Beyne,
Bart Swinnen:
3D Stacked IC demonstrator using Hybrid Collective Die-to-Wafer bonding with copper Through Silicon Vias (TSV).
3DIC 2009: 1-5 |
| 2007 |
| 6 |  | Kerem Akarvardar,
Abdelkarim Mercha,
Eddy Simoen,
Vaidyanathan Subramanian,
Cor Claeys,
Pierre Gentil,
Sorin Cristoloveanu:
High-temperature performance of state-of-the-art triple-gate transistors.
Microelectronics Reliability 47(12): 2065-2069 (2007) |
| 2006 |
| 5 |  | J. M. Rafí,
Eddy Simoen,
K. Hayama,
Abdelkarim Mercha,
F. Campabadal,
H. Ohyama,
Cor Claeys:
Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs.
Microelectronics Reliability 46(9-11): 1657-1663 (2006) |
| 4 |  | K. Hayama,
K. Takakura,
K. Shigaki,
H. Ohyama,
J. M. Rafí,
Abdelkarim Mercha,
Eddy Simoen,
Cor Claeys:
Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation.
Microelectronics Reliability 46(9-11): 1731-1735 (2006) |
| 2005 |
| 3 |  | Abdelkarim Mercha:
Technology and architecture for deep submicron RF CMOS technology.
SBCCI 2005: 4 |
| 2 |  | Wutthinan Jeamsaksiri,
Abdelkarim Mercha,
Javier Ramos,
Stefaan Decoutere,
Florence Cubaynes:
RFCV Test Structure Design for a Selected Frequency Range.
IEICE Transactions 88-C(5): 817-823 (2005) |
| 1 |  | K. Hayama,
K. Takakura,
H. Ohyama,
S. Kuboyama,
S. Matsuda,
J. M. Rafí,
Abdelkarim Mercha,
Eddy Simoen,
Cor Claeys:
Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs.
Microelectronics Reliability 45(9-11): 1376-1381 (2005) |