 | 2012 |
| 7 |  | Ying Shi,
William Q. Meeker:
Bayesian Methods for Accelerated Destructive Degradation Test Planning.
IEEE Transactions on Reliability 61(1): 245-253 (2012) |
| 2011 |
| 6 |  | Shuen-Lin Jeng,
Bei-Ying Huang,
William Q. Meeker:
Accelerated Destructive Degradation Tests Robust to Distribution Misspecification.
IEEE Transactions on Reliability 60(4): 701-711 (2011) |
| 2010 |
| 5 |  | Haiming Ma,
William Q. Meeker:
Strategy for Planning Accelerated Life Tests With Small Sample Sizes.
IEEE Transactions on Reliability 59(4): 610-619 (2010) |
| 4 |  | Yili Hong,
Haiming Ma,
William Q. Meeker:
A Tool for Evaluating Time-Varying-Stress Accelerated Life Test Plans With Log-Location-Scale Distributions.
IEEE Transactions on Reliability 59(4): 620-627 (2010) |
| 2008 |
| 3 |  | Yili Hong,
William Q. Meeker,
Luis A. Escobar:
The Relationship Between Confidence Intervals for Failure Probabilities and Life Time Quantiles.
IEEE Transactions on Reliability 57(2): 260-266 (2008) |
| 2007 |
| 2 |  | James D. McCalley,
Vasant Honavar,
Sarah M. Ryan,
William Q. Meeker,
Daji Qiao,
Ronald A. Roberts,
Yuan Li,
Jyotishman Pathak,
Mujing Ye,
Yili Hong:
Integrated Decision Algorithms for Auto-steered Electric Transmission System Asset Management.
International Conference on Computational Science (1) 2007: 1066-1073 |
| 2006 |
| 1 |  | James D. McCalley,
Vasant Honavar,
Sarah M. Ryan,
William Q. Meeker,
Ronald A. Roberts,
Daji Qiao,
Yuan Li:
Auto-steered Information-Decision Processes for Electric System Asset Management.
International Conference on Computational Science (3) 2006: 440-447 |