Michael Meeder

	2011
2		Michael Meeder, Leslie Marchut, Michael J. Antonell, Michael T. Fresina, Christopher E. Novak, Terry C. Darche: Application of Machine Model ESD tester to high volume capacitor reliability testing. Microelectronics Reliability 51(2): 246-251 (2011)
	2005
1		Charles S. Whitman, Michael Meeder: Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method. Microelectronics Reliability 45(12): 1882-1893 (2005)

Coauthor Index

1	Michael J. Antonell	[2]
2	Terry C. Darche	[2]
3	Michael T. Fresina	[2]
4	Leslie Marchut	[2]
5	Christopher E. Novak	[2]
6	Charles S. Whitman	[1]

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